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Structure optimization of high indium content InGaAs/InP heterostructure for the growth of In0.82Ga0.18As buffer layer 期刊论文
Optoelectronics Letters, 2016, 卷号: 12, 期号: 6
作者:  Wei, Q.-l.;  Z.-x. Guo;  L. Zhao;  L. Zhao;  D.-z. Yuan
收藏  |  浏览/下载:13/0  |  提交时间:2017/09/11
Spectral calibration of medical microscopic imaging spectrometer 期刊论文
Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2016, 卷号: 24, 期号: 5
作者:  Wei, W.;  J.-C. Cui;  Y.-G. Tang;  C. Sun and M.-Z. Pan
收藏  |  浏览/下载:14/0  |  提交时间:2017/09/11
Efficient Perovskite Solar Cells Based on Multilayer Transparent Electrodes through Morphology Control 期刊论文
Journal of Physical Chemistry C, 2016, 卷号: 120, 期号: 47
作者:  Liu, X.;  X. Y. Guo;  Z. H. Gan;  N. Zhang and X. Y. Liu
收藏  |  浏览/下载:21/0  |  提交时间:2017/09/11
延伸波长In0.82Ga0.18As 红外探测器器件结构优化设计 学位论文
硕士: 中国科学院大学, 2014
赵旭
收藏  |  浏览/下载:95/0  |  提交时间:2015/05/03
Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique 会议论文
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
Zhang T.; Miao G.; Fu J.; Ban D.; Shen Z.; Lin H.; Zou X.; Peng H.
收藏  |  浏览/下载:37/0  |  提交时间:2014/05/15
Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique (EI CONFERENCE) 会议论文
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
Zhang T.; Miao G.; Fu J.; Ban D.; Shen Z.; Lin H.; Zou X.; Peng H.
收藏  |  浏览/下载:20/0  |  提交时间:2013/03/25
InP/In0.82Ga0.18As/InP heterostructure used for infrared detector were grown on (100) S-doped InP substrates using two-step growth technique by low temperature metal-organic chemical vapor deposition. The growth was performed using TMIn  TMGa  AsH3  and PH3 as growth precursors in a horizontal reactor. The substrates on a graphite susceptor were heated by inductively coupling RF power  their temperatures were detected by a thermocouple  and the reactor pressure was kept at 10000 Pa. The growth structure of detector included In0.82Ga0.18As buffer with the thickness of 100 nm  In0.82Ga0.18As absorption layer with the thickness of 2.8 m  and the InP cap with the thickness of 0.8 m. The planar type of p-i-n detector was fabricated by Zn diffusion. The properties of In0.82Ga0.18As detector were studied  the curves of the I-V characteristics  the range of response spectrum  and the detectivity (D*) were obtained. (2013) Trans Tech Publications  Switzerland.  
Influence of buffer layer thickness and epilayer's growth temperature on crystalline quality of InAs0.6P0.4InP grown by LP-MOCVD 期刊论文
Solid State Communications, 2011, 卷号: 151, 期号: 12, 页码: 904-907
Liu X.; Song H.; Miao G.; Jiang H.; Cao L.; Sun X.; Li D.; Chen Y.; Li Z.
收藏  |  浏览/下载:19/0  |  提交时间:2012/10/21
Influence of buffer layer thickness and epilayer's growth temperature on crystalline quality of InAs0.6P0.4/Inp grown by LP-MOCVD 期刊论文
Solid State Communications, 2011, 卷号: 151, 期号: 12, 页码: 904-907
Liu X.; Song H.; Miao G. Q.; Jiang H.; Cao L. Z.; Sun X. J.; Li D. B.; Chen Y. R.; Li Z. M.
收藏  |  浏览/下载:12/0  |  提交时间:2012/10/21
Influence of thermal annealing duration of buffer layer on the crystalline quality of In0.82Ga0.18As grown on InP substrate by LP-MOCVD 期刊论文
Applied Surface Science, 2011, 卷号: 257, 期号: 6, 页码: 1996-1999
Liu X.; Song H.; Miao G. Q.; Jiang H.; Cao L. Z.; Li D. B.; Sun X. J.; Chen Y. R.
收藏  |  浏览/下载:13/0  |  提交时间:2012/10/21
Effect of In content of the buffer layer on crystalline quality and electrical property of In0.82Ga0.18As/InP grown by LP-MOCVD 期刊论文
Microelectronics Journal, 2007, 卷号: 38, 期号: 3, 页码: 398-400
Zhang T. M.; Miao G. Q.; Jin Y. X.; Xie J. C.; Jiang H.; Li Z. M.; Song H.
收藏  |  浏览/下载:11/0  |  提交时间:2012/10/21


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