CORC

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CORC

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A Simple Method to Decompose the Amplitudes of Different Random Variation Sources in FinFET Technology 其他
2016-01-01
Jiang, Xiaobo; Wang, Runsheng; Huang, Ru; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
Simulation of correlated line-edge roughness in multi-gate devices 其他
2013-01-01
Jiang, Xiaobo; Wang, Runsheng; Huang, Ru; Chen, Jiang
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Investigations on the Correlation between Line-edge-roughness (LER) and Line-width-roughness (LWR) in Nanoscale CMOS Technology 其他
2012-01-01
Jiang, Xiaobo; Li, Meng; Wang, Runsheng; Chen, Jiang; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors 其他
2011-01-01
Yang, Yunxiang; Du, Gang; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
New Observations of Suppressed Randomization in LER/LWR of Si Nanowire Transistors: Experiments and Mechanism Analysis 其他
2010-01-01
Wang, Runsheng; Yu, Tao; Huang, Ru; Ai, Yujie; Pu, Shuangshuang; Hao, Zhihua; Zhuge, Jing; Wang, Yangyuan
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Variability in Nano-scale Intrinsic Silicon-on-Thin-Box MOSFETs (SOTB MOSFETs) 其他
2010-01-01
Yang, Yunxiang; Du, Gang; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Simulation of Line-Edge Roughness Effects in Silicon Nanowire MOSFETs 其他
2010-01-01
Yu, Tao; Wang, Runsheng; Huang, Ru
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13
Variability induced by line edge roughness in silicon on thin box (SOTB) MOSFETs 其他
2010-01-01
Yang, Yunxiang; Liu, Xiaoyan; Du, Gang; Han, Ruqi
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/13
Investigation on the effective immunity to process induced line-edge roughness in silicon nanowire MOSFETs 其他
2010-01-01
Yu, Tao; Ding, Wei; Zhuge, Jing; Zhang, Liangliang; Wang, Runsheng; Ru, Huang
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Triple-Gate Fin Field Effect Transistors with Fin-Thickness Optimization to Reduce the Impact of Fin Line Edge Roughness 其他
2009-01-01
Yu, Shimeng; Zhao, Yuning; Du, Gang; Kang, Jinfeng; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10

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