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科研机构
北京大学 [13]
内容类型
期刊论文 [7]
其他 [6]
发表日期
2017 [1]
2014 [4]
2013 [2]
2011 [2]
2010 [2]
2009 [2]
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New Understanding of Random Telegraph Noise Amplitude in Tunnel FETs
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017
Chen, Cheng
;
Huang, Qianqian
;
Zhu, Jiadi
;
Zhao, Yang
;
Guo, Lingyi
;
Huang, Ru
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2017/12/03
Amplitude
annealing process
band-to-band tunneling (BTBT) generation rate
nonuniformity
random dopant fluctuation (RDF)
random telegraph noise (RTN)
source doping concentration
tunnel FET (TFET)
FIELD-EFFECT TRANSISTORS
RANDOM DOPANT FLUCTUATION
LINE-EDGE ROUGHNESS
1/F NOISE
ELECTRICAL NOISE
CMOS DEVICES
VARIABILITY
IMPACT
TFET
Experimental study on the oxide trap coupling effect in metal oxide semiconductor field effect transistors with HfO2 gate dielectrics
期刊论文
应用物理学快报, 2014
Ren, Pengpeng
;
Wang, Runsheng
;
Jiang, Xiaobo
;
Qiu, Yingxin
;
Liu, Changze
;
Huang, Ru
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2015/11/10
Impact of Random Interface Traps and Random Dopants in High-k/Metal Gate Junctionless FETs
期刊论文
ieee 纳米技术汇刊, 2014
Wang, Yijiao
;
Huang, Peng
;
Wei, Kangliang
;
Zeng, Lang
;
Liu, Xiaoyan
;
Du, Gang
;
Zhang, Xing
;
Kang, Jinfeng
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2015/11/10
High-k/metal gate (HKMG)
junctionless FET (JL-FET)
random dopant fluctuation (RDF)
random interface traps (RITs)
TCAD simulation
MOSFETS
FLUCTUATIONS
VARIABILITY
SIMULATION
Impact of random discrete dopant in extension induced fluctuation in gate-source/drain underlap FinFET
期刊论文
日本应用物理学杂志, 2014
Wang, Yijiao
;
Huang, Peng
;
Xin, Zheng
;
Zeng, Lang
;
Liu, Xiaoyan
;
Du, Gang
;
Kang, Jinfeng
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2015/11/10
DRIFT-DIFFUSION SIMULATIONS
K SPACER
OPTIMIZATION
PERFORMANCE
DESIGN
Impact of random discrete dopant in extension induced fluctuation in gate-source/drain underlap FinFET
其他
2014-01-01
Wang, Yijiao
;
Huang, Peng
;
Xin, Zheng
;
Zeng, Lang
;
Liu, Xiaoyan
;
Du, Gang
;
Kang, Jinfeng
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX
期刊论文
ieee电子器件汇刊, 2013
Yang, Yunxiang
;
Markov, Stanislav
;
Cheng, Binjie
;
Zain, Anis Suhaila Mohd
;
Liu, Xiaoyan
;
Asenov, Asen
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/13
Back-gate bias
line edge roughness (LER)
metal gate granularity (MGG)
random dopant fluctuation (RDF)
statistical variability (SV)
thin buried oxide (BOX)
INTRINSIC PARAMETER FLUCTUATIONS
SIMULATION
DECANANOMETER
IMPACT
Impacts of short-channel effects on the random threshold voltage variation in nanoscale transistors
期刊论文
Science China(Information Sciences), 2013
WANG RunSheng
;
YU Tao
;
HUANG Ru
;
WANG YangYuan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
MOSFET
short-channel effects(SCEs)
random variation
random dopant fluctuation(RDF)
variability
electrostatic integrity
Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization
期刊论文
ieee电子器件汇刊, 2011
Wang, Runsheng
;
Jing Zhuge
;
Huang, Ru
;
Yu, Tao
;
Zou, Jibin
;
Kim, Dong-Won
;
Park, Donggun
;
Wang, Yangyuan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/10
Line-edge roughness (LER)
metal-gate work function variation (WFV)
modeling
random dopant fluctuation (RDF)
Si nanowire metal-oxide-semiconductor field-effect transistor (MOSFET) (SNWT)
variability
INTRINSIC PARAMETER FLUCTUATIONS
THRESHOLD VOLTAGE FLUCTUATION
CARRIER TRANSPORT
PERFORMANCE
IMPACT
TRANSISTORS
CMOS
DECANANOMETER
INTEGRATION
MOBILITY
Numerical study on effect of random dopant fluctuation on double gate MOSFET based 6-T SRAM performance
其他
2011-01-01
Zhang, Xiufang
;
Ma, Chenyue
;
Zhao, Wei
;
Zhang, Chenfei
;
Wang, Guozeng
;
Wu, Wen
;
Wang, Wenping
;
Cao, Yu
;
Yang, Shengqi
;
Yang, Zhang
;
Ma, Yong
;
Ye, Yun
;
Li, Yongliang
;
Wang, Ruonan
;
Wang, Ruonan
;
He, Jin
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2015/11/13
Variability investigation of gate-all-around silicon nanowire transistors from top-down approach
其他
2010-01-01
Huang, R.
;
Wang, R.S.
;
Zhuge, J.
;
Yu, T.
;
Ai, Y.J.
;
Fan, C.
;
Pu, S.S.
;
Zou, J.B.
;
Huang, X.
;
Wang, Y.Y.
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2015/11/13
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