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Influence of the Surfaces Characteristics on the Luminescent Property of Porous Silicon 会议论文
INNOVATIVE MATERIALS: ENGINEERING AND APPLICATIONS, 2014-10-18
作者:  Ding, Yan-Li[1];  Zhao, Yue[2];  Feng, Yue[3];  Liang, Xiao-Yan[4];  Wang, Lin-Jun[5]
收藏  |  浏览/下载：5/0  |  提交时间：2019/04/30
Surface morphology and roughness of Cu thin films prepared by ionized cluster beam deposition 会议论文
2012 International Conference on Frontiers of Advanced Materials and Engineering Technology, FAMET 2012, Xiamen, China, January 4, 2012 - January 5, 2012
作者:  Cao, Bo;  Yang, Tongrui;  Li, Gongping;  Cho, Seong Jin;  Kim, Hee
收藏  |  浏览/下载：2/0  |  提交时间：2017/01/20
Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE) 会议论文
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China
Wang X.-J.; Li X.-Z.; Su S.-C.
收藏  |  浏览/下载：26/0  |  提交时间：2013/03/25
A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper  we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case  we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values  the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore  we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.  
Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
Meng Y.; Chen B.; Chen C.
收藏  |  浏览/下载：18/0  |  提交时间：2013/03/25
A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.  
Fabrication and mechanical properties of HAp/Ti/sub 3/SiC/sub 2/ (60 vol.%) composite by sparkle plasma sintering 会议论文
Key Engineering Materials, 3rd International Conference on High-Performance Ceramics (CICC-3), Shenzhen, China, INSPEC
Suilin Shi; Wei Pan; Minghao Fang; Zhenyi Fang
收藏  |  浏览/下载：4/0
Simulation of interface structure influence on in-plane thermal conductivity of Ar-like nano films by molecular dynamics 会议论文
JOURNAL OF ENHANCED HEAT TRANSFER, 13th International Heat Transfer Conference, Sydney, AUSTRALIA, Web of Science
Liang, X. G.; Yue, B.; Maruyama, S.
收藏  |  浏览/下载：4/0
High-temperature mechanical properties of Al/sub 2/O/sub 3 //Ti/sub 3/SiC/sub 2/ multilayer ceramics 会议论文
Key Engineering Materials, 3rd International Conference on High-Performance Ceramics (CICC-3), Shenzhen, China, INSPEC
Zan, Q.F.; Wang, C.; Dong, L.M.; Wang, C.A.; Huang, Y.
收藏  |  浏览/下载：2/0
Mechanical properties and microstructure of Al/sub 2/O/sub 3 /-Ti/sub 3/SiC/sub 2/ ceramic composites 会议论文
Key Engineering Materials, Euro Ceramics. 8th Conference and Exhibition of the European Ceramic Society, Istanbul, Turkey, INSPEC
Pan, W.; Wang, R.G.; Luo, Y.; Qi, L.; Miao, H.
收藏  |  浏览/下载：5/0
Erosion wear characteristics of Si/sub 3/N/sub 4/ fabricated from low-cost powders 会议论文
Key Engineering Materials, 3rd International Conference on High-Performance Ceramics (CICC-3), Shenzhen, China, INSPEC
Bing Wu; Longhao Qi; Jian Shen
收藏  |  浏览/下载：1/0
Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C.
收藏  |  浏览/下载：17/0  |  提交时间：2013/03/25
A soft x-ray reflectometer with laser produced plasma source has been designed  which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above  the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand  both the two samples are measured by WYKO surface profiler  and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler  which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO  and the possible reasons of such difference have been discussed in detail. 2009 SPIE.  

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