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	Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE)
	Wang X.-J. ; Li X.-Z. ; Su S.-C.
	2011
会议名称	MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011
会议地点	Guilin, China
关键词	A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33805]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Wang X.-J.,Li X.-Z.,Su S.-C.. Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE)[C]. 见:MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011. Guilin, China.

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