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CORC

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Graph Neural Network based on Geometric and Appearance Attention for 6D Pose Estimation 会议论文
Virtual, Online, China, September 17-19, 2021
作者:  Wang TF(王天夫);  Wang HG(王洪光)
收藏  |  浏览/下载：4/0  |  提交时间：2022/03/23
R2R Controller Design Using T-S Fuzzy Model and Extended State Observer 会议论文
2017 6TH INTERNATIONAL SYMPOSIUM ON ADVANCED CONTROL OF INDUSTRIAL PROCESSES (ADCONIP), 2017-01-01
作者:  Wang, Haiyan[1];  Tan, Fei[2];  Sheng, Biqi[3];  Fu, Haijun[4];  Pan, Tianhong[5]
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/24
R2R Controller Design Using T-S Fuzzy Model and Extended State Observer 会议论文
6th International Symposium on Advanced Control of Industrial Processes (AdCONIP)
作者:  Wang, Haiyan[1];  Tan, Fei[2];  Sheng, Biqi[3];  Fu, Haijun[4];  Pan, Tianhong[5]
收藏  |  浏览/下载：8/0  |  提交时间：2019/12/24
聚乳酸增塑改性及其形状记忆性能 会议论文
化学年会2016, 大连
作者:  王娟;  崔欢庆;  唐天洪;  杜学敏;  吴天准
收藏  |  浏览/下载：39/0  |  提交时间：2017/01/15
Poly(N-isopropylacrylamide) Hydrogel-Based Shape-Adjustable Polyimide Films Triggered by Near-Human-Body Temperature 会议论文
EMBC2016, Florida
作者:  Huanqing Cui;  Xuemin Du;  Juan Wang;  Tianhong Tang;  Tianzhun Wu
收藏  |  浏览/下载：28/0  |  提交时间：2017/01/15
光致形变植入式柔性电极的制备 会议论文
化学年会2016, 大连
作者:  崔欢庆;  王娟;  唐天洪;  杜学敏;  吴天准
收藏  |  浏览/下载：43/0  |  提交时间：2017/01/15
Vapor condensation assisted reverse display for anti-counterfeiting applications 会议论文
NEMS2016, Matsushima Bay and Sendai City
作者:  Xuemin Du;  Juan Wang;  Huanqing Cui;  Tianhong Tang;  Tianzhun Wu
收藏  |  浏览/下载：15/0  |  提交时间：2017/01/15
Run-to-Run Control for Semiconductor Manufacturing Processes using Extended State Observer 会议论文
28th Chinese Control and Decision Conference, 2016-01-01
作者:  Wang, Haiyan[1];  Tan, Fei[2];  Sheng, Biqi[3];  Bian, Jun[4];  Pan, Tianhong[5]
收藏  |  浏览/下载：15/0  |  提交时间：2019/12/24
Run-to-Run Control for Semiconductor Manufacturing Processes using Extended State Observer 会议论文
PROCEEDINGS OF THE 28TH CHINESE CONTROL AND DECISION CONFERENCE (2016 CCDC)
作者:  Wang, Haiyan[1];  Tan, Fei[2];  Sheng, Biqi[3];  Bian, Jun[4];  Pan, Tianhong[5]
收藏  |  浏览/下载：9/0  |  提交时间：2019/12/24
Run-to-run control for semiconductor manufacturing processes using extended state observer 会议论文
28th Chinese Control and Decision Conference, CCDC 2016, 2016-05-28
作者:  Wang, Haiyan[1];  Tan, Fei[2];  Sheng, Biqi[3];  Bian, Jun[4];  Pan, Tianhong[5]
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/24

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