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A Novel Stackelberg-Game-Based Energy Storage Sharing Scheme Under Demand Charge
期刊论文
IEEE/CAA Journal of Automatica Sinica, 2023, 卷号: 10, 期号: 2, 页码: 462-473
作者:
Bingyun Li
;
Qinmin Yang
;
Innocent Kamwa
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2023/01/16
Bi-level optimization
demand charge
energy storage system (ESS) sharing
energy transaction
mathematical program with equilibrium constraints (MPEC)
stackelberg game
Offset-free Column Buffer for CMOS image sensor
会议论文
2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019-01-01
作者:
Guo, Zhongjie
;
Zhang, Qian
;
Jing, Kai
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  |  
浏览/下载:11/0
  |  
提交时间:2019/12/20
CMOS image sensor
column readout
buffer
offset mismatch
charge sharing
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose
会议论文
Geneva, SWITZERLAND, OCT 02-06, 2017
作者:
Zheng, Qiwen
;
Cui, Jiangwei
;
Lu, Wu
;
Guo, Hongxia
;
Liu, Jie
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  |  
浏览/下载:40/0
  |  
提交时间:2018/10/08
Charge sharing
single-event upset (SEU)
static random access memory
total ionizing dose (TID)
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1920-1927
作者:
Zheng, QW (Zheng, Qiwen)[ 1 ]
;
Cui, JW (Cui, Jiangwei)[ 1 ]
;
Lu, W (Lu, Wu)[ 1 ]
;
Guo, HX (Guo, Hongxia)[ 1 ]
;
Liu, J (Liu, Jie)[ 2 ]
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  |  
浏览/下载:53/0
  |  
提交时间:2018/09/27
Charge Sharing
Single-event Upset (Seu)
Static Random Access Memory
Total Ionizing Dose (Tid)
Dual-Voltage Single-Rail Dynamic DPA-Resistant Logic Based on Charge Sharing Mechanism
期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2017
Tang Wenyi
;
Jia Song
;
Wang Yuan
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  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
DPA
Charge sharing
Three-phase logic family
Side-channel attacks
Transient Recovery Voltage Distribution Ratio and Voltage Sharing Measure of Double- and Triple-Break Vacuum Circuit Breakers
期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2016, 卷号: 6, 期号: 4
作者:
Huang, Daochun
;
Shu, Shengwen
;
Ruan, Jiangjun
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  |  
浏览/下载:3/0
  |  
提交时间:2019/12/05
Distribution ratio
double break
grading capacitor
postarc current (PAC)
residual charge (RC)
transient recovery voltage (TRV)
triple-break
vacuum circuit breaker (VCB)
voltage sharing measure
DICE-based test structure to measure the strength of charge sharing effect
期刊论文
IEICE ELECTRONICS EXPRESS, 2015, 卷号: Vol.12 No.22
作者:
Hui, Xu
;
Yun, Zeng
;
Bin, Liang
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  |  
浏览/下载:5/0
  |  
提交时间:2019/12/31
DICE
charge
sharing
strength
test
structure
DICE-Based Test Structure to Measure the Strength of Charge Sharing Effect
期刊论文
IEICE Electron. Express, 2015, 卷号: Vol.12 No.0
作者:
Hui Xu
;
Yun Zeng
;
Bin Liang
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  |  
浏览/下载:2/0
  |  
提交时间:2019/12/31
DICE
charge
sharing
strength
test
structure
Modeling and simulation of single-event effect in CMOS circuit
期刊论文
Journal of Semiconductors, 2015, 卷号: 36
作者:
Yue, S.
;
Zhang, X.
;
Zhao, Y.
;
Liu, L.
;
Wang, H.
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  |  
浏览/下载:6/0
  |  
提交时间:2019/12/30
Bipolar semiconductor devices
CMOS integrated circuits
Digital devices
Digital storage
High electron mobility transistors
Integrated circuits
Ionization
Ionizing radiation
Nanotechnology
Radiation hardening
Reconfigurable hardware
Semiconductor devices
Charge collection
Charge sharing effects
Circuit-level simulation
Model and simulation
Multi-nodes
Single event effects
Single event transients
Single event upsets
Transients
Charge sharing effect on 600 mu m pitch pixelated CZT detector for imaging applications
期刊论文
CHINESE PHYSICS C, 2014, 卷号: 38, 期号: 11, 页码: 116002-1-116002-5
作者:
Yin, YZ
;
Liu, Q
;
Xu, DP
;
Chen, XM
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  |  
浏览/下载:4/0
  |  
提交时间:2015/12/15
CZT detector
charge sharing
energy resolution
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