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	DICE-based test structure to measure the strength of charge sharing effect
	Hui, Xu; Yun, Zeng; Bin, Liang
刊名	IEICE ELECTRONICS EXPRESS
	2015
卷号	Vol.12 No.22
关键词	DICE charge sharing strength test structure
ISSN号	1349-2543
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6092653
专题	湖南大学
作者单位	1.School of Physics and Electronics, Hunan University, Changsha 2.410082, China 3.College of Computer, National University of Defense Technology, Hunan University, Changsha 4.410073, China
推荐引用方式 GB/T 7714	Hui, Xu,Yun, Zeng,Bin, Liang. DICE-based test structure to measure the strength of charge sharing effect[J]. IEICE ELECTRONICS EXPRESS,2015,Vol.12 No.22.
APA	Hui, Xu,Yun, Zeng,&Bin, Liang.(2015).DICE-based test structure to measure the strength of charge sharing effect.IEICE ELECTRONICS EXPRESS,Vol.12 No.22.
MLA	Hui, Xu,et al."DICE-based test structure to measure the strength of charge sharing effect".IEICE ELECTRONICS EXPRESS Vol.12 No.22(2015).

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