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Cu–Ni–Sn–Si alloys designed by cluster-plus-glue-atom model
期刊论文
Materials and Design, 2019, 卷号: 167
作者:
Yu, Q.X.
;
Li, X.N.
;
Wei, K.R.
;
Li, Z.M.
;
Zheng, Y.H.
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2020/11/14
Atoms
Copper alloys
Glues
Gluing
Lamellar structures
Precipitation (chemical)
Segregation (metallography)
Silicon alloys
Ternary alloys
Cluster models
Commercial alloys
Composition design
Discontinuous precipitation
High temperature stability
Liquidus temperature
Processing performance
Solidification process
Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug
期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2019, 卷号: 38, 期号: 4, 页码: 767-779
作者:
Wang, Ying
;
Cheng, Yun
;
Li, Huawei
;
Li, Xiaowei
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2019/08/16
Cluster generation
post-silicon debug
state restoration
trace signal selection
Structural and Electronic Properties of Binary Clusters SimGen (m plus n=6-13)
期刊论文
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2019, 卷号: 19, 页码: 7879-7885
作者:
Huang, Yingying
;
Liang, Xiaoqing
;
Li, Zhe
;
Sai, Linwei
;
Zhao, Jijun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/02
Binary Cluster
Silicon and Germanium
Medium Size
Sputtering of silicon nanopowders by an argon cluster ion beam
期刊论文
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2019, 卷号: 10
作者:
Zeng, Xiaomei
;
Pelenovich, Vasiliy
;
Wang, Zhenguo
;
Zuo, Wenbin
;
Belykh, Sergey
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/05
finite size effect
gas cluster ion beam
silicon nanoparticles
smoothing effect
sputtering
Revisit of Si-n (n=21-29) Clusters by Ab Initio Global Search
期刊论文
JOURNAL OF CLUSTER SCIENCE, 2017, 卷号: 28, 页码: 1729-1737
作者:
Sai, Linwei
;
Wu, Xue
;
Huang, Xiaoming
;
Zhao, Jijun
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/02
Silicon cluster
Structure
Genetic algorithm
Ab initio
Microscopic mechanism for light-induced degradation of silicon solar cell in water vapor environment
期刊论文
NANO ENERGY, 2016, 卷号: 30, 页码: 614-620
作者:
Yang, JR
;
Fang, HP
;
Gao, Y
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2017/03/02
Silicon cluster
Water Vapor
Oxidation
Degradation
Atomistic study of the copper cluster deposition on Si(001) and Si(111) surface
会议论文
Chinese Materials Congress on Methods of Design and Characterization of Materials, Research and Development of Technological Processes, 2015, Guiyang, China, July 10, 2015 - July 14, 2015
作者:
Gong, Hengfeng
;
Li, Gongping
;
Zhang, Shixu
;
Lu, Wei
;
Wang, Lumin
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/01/20
Silicon
Characterization
Deposition
Film growth
Interfaces (materials)
Mixing
Molecular dynamics
Morse potential
Silicides
Substrates
Surface segregation
Cluster
Cluster deposition
Crystallographic orientations
Epitaxial relations
Film-substrate interfaces
Molecular dynamics simulations
Silicide formation
Silicon segregation
Parity Alternation of Silicon-doped Ternary Cationic Clusters HCnSi2+ (n=1 similar to 9)
期刊论文
CHINESE JOURNAL OF STRUCTURAL CHEMISTRY, 2014, 卷号: 33, 页码: 959-970
作者:
Qi Jia-Yuan
;
Zhu Huan-Huan
;
Huang Xin
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/11/21
silicon-doped carbon clusters
HCnSi2+
ternary cationic clusters
coupled cluster method
A systematic search for the structures, stabilities, and electronic properties of bimetallic Ca-2-doped gold clusters: comparison with pure gold clusters
期刊论文
Journal of Molecular Modeling, 2012, 卷号: 18, 期号: 4, 页码: 1333-1343
Y. R. Zhao
;
X. Y. Kuang
;
P. Shao
;
C. G. Li
;
S. J. Wang
;
Y. F. Li
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2013/02/05
Ca-Au cluster
Geometric configuration
Density functional theory
density-functional theory
transition-metal atoms
ab-initio
silver
clusters
silicon clusters
n=1-4 clusters
basis-sets
polarizability
ag
potentials
Surface morphology and roughness of Cu thin films prepared by ionized cluster beam deposition
会议论文
2012 International Conference on Frontiers of Advanced Materials and Engineering Technology, FAMET 2012, Xiamen, China, January 4, 2012 - January 5, 2012
作者:
Cao, Bo
;
Yang, Tongrui
;
Li, Gongping
;
Cho, Seong Jin
;
Kim, Hee
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/01/20
Surface morphology
Atomic force microscopy
Chemical modification
Copper
Deposition
Engineering technology
Ionization
Ions
Morphology
Semiconducting silicon compounds
Surface roughness
Surfaces
Thin films
Vapor deposition
Acceleration voltages
Average grain size
Cu Films
Cu thin film
Deposition conditions
Ionized cluster beam deposition
Ionized cluster beams
P-type Si
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