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Impact of heavy ion energy and species on single-event upset in commercial floating gate cells 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 120, 页码: 6
作者:  Ye, Bing;  Mo, Li-Hua;  Zhai, Peng-Fei;  Cai, Li;  Liu, Tao
收藏  |  浏览/下载:44/0  |  提交时间:2021/12/09
Heavy-ion induced radiation effects in 50 nm NAND floating gate flash memories 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 102, 页码: 6
作者:  Yin, Ya-nan;  Liu, Jie;  Liu, Tian-qi;  Ye, Bing;  Ji, Qing-gang
收藏  |  浏览/下载:9/0  |  提交时间:2022/01/19
Influences of total ionizing dose on single event effect sensitivity in floating gate cells 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 8, 页码: 086103
作者:  Zhao, Pei-Xiong;  Liu, Tian-Qi;  Ye, Bing;  Luo, Jie;  Sun, You-Mei
收藏  |  浏览/下载:36/0  |  提交时间:2018/10/08
Anomalous annealing of floating gate errors due to heavy ion irradiation 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 418, 页码: 80-86
作者:  Hou, Mingdong;  Zhao, Peixiong;  Luo, Jie;  Ji, Qinggang;  Ye, Bing
收藏  |  浏览/下载:58/0  |  提交时间:2018/05/31
DLV: Exploiting Device Level Latency Variations for Performance Improvement on Flash Memory Storage Systems 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2018, 卷号: 37, 页码: 1546-1559
作者:  Cui, Jinhua;  Zhang, Youtao;  Wu, Weiguo;  Yang, Jun;  Wang, Yinfeng
收藏  |  浏览/下载:7/0  |  提交时间:2019/11/26
Improving Write Performance and Extending Endurance of Object-Based NAND Flash Devices 期刊论文
ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS, 2018, 卷号: 17, 期号: 1,SI
作者:  Guo, Jie[1];  Min, Chuhan[2];  Cai, Tao[3];  Chen, Yiran[4]
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/24
A Design to Reduce Write Amplification in Object-based NAND Flash Devices 会议论文
International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS), 2016-10-01
作者:  Guo, Jie[1];  Min, Chuhan[2];  Cai, Tao[3];  Chen, Yiran[4]
收藏  |  浏览/下载:9/0  |  提交时间:2019/12/24
An adaptive ECC scheme for dynamic protection of NAND Flash memories 会议论文
Brisbane, Australia, 19-24 April 2015
作者:  Yuan L(袁柳);  Liu HD(刘怀达);  Jia PG(贾品贵);  Yang YP(杨一平)
收藏  |  浏览/下载:19/0  |  提交时间:2016/06/16
Reliability-Based ECC System for Adaptive Protection of NAND Flash Memories 会议论文
Gwalior, 印度, 2015-04-04 - 2015-04-06
作者:  Yuan L(袁柳);  Liu HD(刘怀达);  Jia PG(贾品贵);  Yang YP(杨一平)
收藏  |  浏览/下载:19/0  |  提交时间:2016/06/16
Rank-Modulation Rewrite Coding for Flash Memories. 期刊论文
IEEE Transactions on Information Theory, 2015, 卷号: Vol.61 No.8, 页码: 4209-4226
作者:  EnGad,Eyal;  Bruck,Jehoshua;  Jiang,AnxiaoAndrew;  Yaakobi,Eitan
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/30


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