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科研机构
西安交通大学 [10]
内容类型
会议论文 [8]
期刊论文 [2]
发表日期
2013 [1]
2012 [7]
2011 [2]
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A design for testability approach for nano-CMOS analogue integrated circuits
期刊论文
INTERNATIONAL JOURNAL OF ELECTRONICS, 2013, 卷号: 100, 期号: [db:dc_citation_issue], 页码: 837-850
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Hamdi, Belgacem
;
Man, Ka Lok
;
Tourki, Rached
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/10
amplitude fluctuation
nano-CMOS technology
fault
testing
checker
DfT
analogue integrated circuits
A CONCURRENT ERROR DETECTION AND CORRECTION BASED FAULT-TOLERANT XOR-XNOR CIRCUIT FOR HIGHLY RELIABLE APPLICATIONS
会议论文
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Hamdi, Belgacem
;
Man, Ka Lok
;
Lim, Eng Gee
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/10
A Self-checking CMOS Full adder in Double Pass Transistor Logic
会议论文
作者:
Khedhiri, Chiraz
;
Karmani, Mouna
;
Hamdi, Belgacem
;
Man, Ka Lok
;
Yang, Yue
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/10
faults
double pass transistor technology
full adder
self-checking
AN EFFICIENT DIFFERENTIAL FULL ADDER
会议论文
作者:
Khedhiri, Chiraz
;
Karmani, Mouna
;
Hamdi, Belgacem
;
Man, Ka Lok
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/10
A Concurrent Error Detection Based Fault Tolerant 32 nm XOR-XNOR Circuit Implementation
会议论文
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Hamdi, Belgacem
;
Man, Ka Lok
;
Lim, Eng Gee
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/10
Fault-tolerant systems
transistor stuck-open fault model
transistor stuck-on fault model
XOR-XNOR circuit
stuck-at fault model
Concurrent Error Detection (CED)
Design of a reliable XOR-XNOR circuit for arithmetic logic units
会议论文
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Hamdi, Belgacem
;
Rahmani, Amir-Mohammad
;
Man, Ka Lok
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/10
Concurrent error detection
Fault model
Fault secure
Self-testing
Xor-xnor circuits
A fault-tolerant 32 nm CMOS double sideband amplitude suppressed carrier modulator-demodulator circuit implementation
期刊论文
International Journal of Computer Science Issues, 2012, 卷号: 9, 期号: [db:dc_citation_issue], 页码: 267-276
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Hamdi, Belgacem
;
Man, ka Lok
;
Lei, Chi-Un
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/10
Amplitude modulators
Circuit implementation
CMOS technology
Double side-band suppressed carriers
Electrical behaviors
Four-quadrant multiplier
Portable communication systems
Safety-critical communication
A self-test and self-repair approach for analog integrated circuits
会议论文
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Man, Ka Lok
;
Krilavicˇius, Tomas
;
Hamdi, Belgacem
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2019/12/10
65 nm CMOS technologies
Bridging fault
Built-in current sensors
Self repair
Self test
Design for testability in nano-CMOS analog integrated circuits using a new design analog checker
会议论文
作者:
Karmani, Mouna
;
Khedhiri, Chiraz
;
Man, Ka Lok
;
Hamdi, Belgacem
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/10
65nm CMOS technology
Checker
Design process
Detection of defects
Nano-CMOS technologies
Safety critical applications
SPICE simulations
System on chips (SoC)
Concurrent error detection adder based on two paths output computation
会议论文
作者:
Khedhiri, Chiraz
;
Karmani, Mouna
;
Hamdi, Belgacem
;
Man, Ka Lok
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/10
Concurrent error detection
Dual modular redundancy
Full adders
Standard CMOS
Style designs
Transient faults
Transistor count
Two paths
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