A design for testability approach for nano-CMOS analogue integrated circuits | |
Karmani, Mouna; Khedhiri, Chiraz; Hamdi, Belgacem; Man, Ka Lok; Tourki, Rached | |
刊名 | INTERNATIONAL JOURNAL OF ELECTRONICS
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2013 | |
卷号 | 100期号:[db:dc_citation_issue]页码:837-850 |
关键词 | amplitude fluctuation nano-CMOS technology fault testing checker DfT analogue integrated circuits |
ISSN号 | 0020-7217 |
DOI | [db:dc_identifier_doi] |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4442835 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Karmani, Mouna,Khedhiri, Chiraz,Hamdi, Belgacem,et al. A design for testability approach for nano-CMOS analogue integrated circuits[J]. INTERNATIONAL JOURNAL OF ELECTRONICS,2013,100([db:dc_citation_issue]):837-850. |
APA | Karmani, Mouna,Khedhiri, Chiraz,Hamdi, Belgacem,Man, Ka Lok,&Tourki, Rached.(2013).A design for testability approach for nano-CMOS analogue integrated circuits.INTERNATIONAL JOURNAL OF ELECTRONICS,100([db:dc_citation_issue]),837-850. |
MLA | Karmani, Mouna,et al."A design for testability approach for nano-CMOS analogue integrated circuits".INTERNATIONAL JOURNAL OF ELECTRONICS 100.[db:dc_citation_issue](2013):837-850. |
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