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	A design for testability approach for nano-CMOS analogue integrated circuits
	Karmani, Mouna; Khedhiri, Chiraz; Hamdi, Belgacem; Man, Ka Lok; Tourki, Rached
刊名	INTERNATIONAL JOURNAL OF ELECTRONICS
	2013
卷号	100期号:[db:dc_citation_issue]页码:837-850
关键词	amplitude fluctuation nano-CMOS technology fault testing checker DfT analogue integrated circuits
ISSN号	0020-7217
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4442835
专题	西安交通大学
推荐引用方式 GB/T 7714	Karmani, Mouna,Khedhiri, Chiraz,Hamdi, Belgacem,et al. A design for testability approach for nano-CMOS analogue integrated circuits[J]. INTERNATIONAL JOURNAL OF ELECTRONICS,2013,100([db:dc_citation_issue]):837-850.
APA	Karmani, Mouna,Khedhiri, Chiraz,Hamdi, Belgacem,Man, Ka Lok,&Tourki, Rached.(2013).A design for testability approach for nano-CMOS analogue integrated circuits.INTERNATIONAL JOURNAL OF ELECTRONICS,100([db:dc_citation_issue]),837-850.
MLA	Karmani, Mouna,et al."A design for testability approach for nano-CMOS analogue integrated circuits".INTERNATIONAL JOURNAL OF ELECTRONICS 100.[db:dc_citation_issue](2013):837-850.

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