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北京大学 [16]
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厦门大学 [1]
大连化学物理研究所 [1]
微电子研究所 [1]
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期刊论文 [22]
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浏览/检索结果:
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Electronic structure of molybdenum-involved amorphous silica buffer layer in MoOx/n-Si heterojunction
期刊论文
APPLIED SURFACE SCIENCE, 2019, 卷号: 473, 页码: 20-24
作者:
Chen, Dongyun[1]
;
Gao, Ming[2]
;
Wan, Yazhou[3]
;
Li, Yonghua[4]
;
Guo, Haibo[5]
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/04/22
Amorphous SiOx(Mo) layer
Density functional theory
Charge transition levels
Trap-assisted tunneling
Heterojunction solar cells
Influences of total ionizing dose on single event effect sensitivity in floating gate cells
期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 8, 页码: 086103
作者:
Zhao, Pei-Xiong
;
Liu, Tian-Qi
;
Ye, Bing
;
Luo, Jie
;
Sun, You-Mei
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2018/10/08
flash memories
heavy ions
synergistic effect
total ionizing dose
Trap-assisted transition between Schottky emission and Fowler-Nordheim tunneling in the interfacial-memristor based on Bi2S3 nano-networks
期刊论文
AIP Advances, 2018, 卷号: 8, 期号: 3, 页码: 035105
作者:
Tian, Ye*
;
Jiang, Lianjun
;
Zhang, Xuejun
;
Zhang, Guangfu
;
Zhu, Qiuxiang
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  |  
浏览/下载:6/0
  |  
提交时间:2019/12/24
Electrical and optical performances of InGaAs/GaAsSb superlattice short-wavelength infrared detectors
期刊论文
OPTICAL ENGINEERING, 2017, 卷号: 56, 期号: 5
作者:
Jin C
;
Chen JX
;
Xu QQ
;
Yu CZ
;
He L
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2018/11/20
short-wavelength infrared
type II InGaAs/GaAsSb superlattice
quantum efficiency
absorption region thickness
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions
其他
2016-01-01
Li, Yun
;
Jiang, Hai
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Hao, Hao
;
Du, Gang
;
Zhang, Xing
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
OXIDE
MODEL
BIAS
DEGRADATION
TECHNOLOGY
DEFECTS
STACKS
NOISE
PBTI
HFO2
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions
期刊论文
International Conference on Solid State Devices and Materials (SSDM), 2016
Li, Yun
;
Jiang, Hai
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Hao, Hao
;
Du, Gang
;
Zhang, Xing
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
OXIDE
MODEL
BIAS
DEGRADATION
TECHNOLOGY
DEFECTS
STACKS
NOISE
PBTI
HFO2
Photomultiplication photodetectors with P3HT: fullerene-free material as the active layers exhibiting a broad response
期刊论文
NANOSCALE, 2016
Wang, Wenbin
;
Zhang, Fujun
;
Bai, Huitao
;
Li, Lingliang
;
Gao, Mile
;
Zhanga, Miao
;
Zhan, Xiaowei
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
POLYMER SOLAR-CELLS
TRAP-ASSISTED PHOTOMULTIPLICATION
EXTERNAL QUANTUM EFFICIENCY
ORGANIC PHOTODIODES
SPECTRAL RESPONSE
HIGH-DETECTIVITY
LIGHT
PERFORMANCE
ABSORPTION
RANGE
Modeling of trap-assisted tunneling on performance of charge trapping memory with consideration of trap position and energy level
期刊论文
CHINESE PHYSICS B, 2016
Lun, Zhi-Yuan
;
Li, Yun
;
Zhao, Kai
;
Du, Gang
;
Liu, Xiao-Yan
;
Wang, Yi
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/04
trap assisted tunneling
charge trapping memory
tunneling oxide degradation
NAND FLASH MEMORY
SIMULATION
SILC
Modeling of trap-assisted tunneling on performance of charge trapping memory with consideration of trap position and energy level
期刊论文
Chinese Physics. B, 2016
Lun Zhiyuan
;
Li Yun
;
Zhao Kai
;
Du Gang
;
Liu Xiaoyan
;
Wang Yi
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
trap assisted tunneling
charge trapping memory
tunneling oxide degradation
Achieving EQE of 16,700% in P3HT: PC71BM based photodetectors by trap-assisted photomultiplication
期刊论文
scientific reports, 2015, 卷号: 5
作者:
Li, Lingliang
;
Zhang, Fujun
;
Wang, Jian
;
An, Qiaoshi
;
Sun, Qianqian
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2015/11/17
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