CORC

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CORC

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SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2022, 卷号: 65, 期号: 2, 页码: 2
作者:  Cai, Chang;  Ning, Bingxu;  Fan, Xue;  Liu, Tianqi;  Ke, Lingyun
收藏  |  浏览/下载：67/0  |  提交时间：2021/12/09
Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu
收藏  |  浏览/下载：68/0  |  提交时间：2022/01/12
Impacts of carbon ions on SEU in SOI SRAM 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 6
作者:  Gao, J.;  Zhang, Q.;  Xi, K.;  Li, B.;  Wang, C.
收藏  |  浏览/下载：27/0  |  提交时间：2022/01/24
SEE  SEU  SOI SRAM  C  
Impact of heavy ion energy and species on single-event upset in commercial floating gate cells 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 120, 页码: 6
作者:  Ye, Bing;  Mo, Li-Hua;  Zhai, Peng-Fei;  Cai, Li;  Liu, Tao
收藏  |  浏览/下载：43/0  |  提交时间：2021/12/09
Neutron-induced single event upset simulation in Geant4 for three-dimensional die-stacked SRAM* 期刊论文
CHINESE PHYSICS B, 2021, 卷号: 30, 期号: 3, 页码: 8
作者:  Mo, Li-Hua;  Ye, Bing;  Liu, Jie;  Luo, Jie;  Sun, You-Mei
收藏  |  浏览/下载：34/0  |  提交时间：2021/12/10
Investigation of single event effect in 28-nm system-on-chip with multi patterns* 期刊论文
CHINESE PHYSICS B, 2020, 卷号: 29, 期号: 10, 页码: 5
作者:  Yang, Wei-Tao;  Li, Yong-Hong;  Guo, Ya-Xin;  Zhao, Hao-Yu;  Li, Yang
收藏  |  浏览/下载：28/0  |  提交时间：2021/12/15
Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs 期刊论文
ELECTRONICS, 2020, 卷号: 9, 期号: 8, 页码: 14
作者:  Zhao, Peixiong;  Liu, Tianqi;  Cai, Chang;  He, Ze;  Li, Dongqing
收藏  |  浏览/下载：16/0  |  提交时间：2021/12/15
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文
Geneva, SWITZERLAND, OCT 02-06, 2017
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载：40/0  |  提交时间：2018/10/08
Influences of total ionizing dose on single event effect sensitivity in floating gate cells 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 8, 页码: 086103
作者:  Zhao, Pei-Xiong;  Liu, Tian-Qi;  Ye, Bing;  Luo, Jie;  Sun, You-Mei
收藏  |  浏览/下载：36/0  |  提交时间：2018/10/08
The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1091-1100
作者:  Gu, Song;  Liu, Jie;  Bi, Jinshun;  Zhao, Fazhan;  Zhang, Zhangang
收藏  |  浏览/下载：25/0  |  提交时间：2018/07/16

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