SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs | |
Cai, Chang2,3,4; Ning, Bingxu1; Fan, Xue5; Liu, Tianqi3,4; Ke, Lingyun2,3; Chen, Gengsheng4; Yu, Jian4; He, Ze2,3; Xu, Liewei4; Liu, Jie3 | |
刊名 | SCIENCE CHINA-INFORMATION SCIENCES |
2022-02-01 | |
卷号 | 65期号:2页码:2 |
ISSN号 | 1674-733X |
DOI | 10.1007/s11432-020-3169-x |
通讯作者 | Cai, Chang(caichang@impcas.ac.cn) ; Liu, Jie(j.liu@impcas.ac.cn) |
英文摘要 | Conclusion This study presents the impact of heavy ions on the SEU features and predicts the on-orbit SEU rate for the space application of high-performance 28 nm bulk SRAM-based FPGAs. The measured SEU cross sections are employed to characterize the radiation sensitivities. The results show a significant difference among the SEU cross sections of CRAMs, BRAMs, and DFFs. The employed test methods have an influence on SEU cross section results, which is verified in our application-oriented BRAM test. In addition, the radiation-sensitive resource such as the clock buffers is essential to further improve the radiation tolerance of FPGA. These results indicate that the reasonable hardening strategies are still useful for the 28 nm bulk CMOS high-performance FPGAs, which significantly promote the space application of the 28 nm high-performance FPGAs. |
资助项目 | National Natural Science Foundation of China[11690041] ; State Key Laboratory of ASIC System[2020KF009] ; HIRFL[JIZR20GY002] |
WOS研究方向 | Computer Science ; Engineering |
语种 | 英语 |
出版者 | SCIENCE PRESS |
WOS记录号 | WOS:000656938000001 |
资助机构 | National Natural Science Foundation of China ; State Key Laboratory of ASIC System ; HIRFL |
内容类型 | 期刊论文 |
源URL | [http://119.78.100.186/handle/113462/137154] |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Cai, Chang; Liu, Jie |
作者单位 | 1.Fudan Univ, Fudan Microelect Grp, Shanghai 200433, Peoples R China 2.Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing 100049, Peoples R China 3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 4.Fudan Univ, State Key Lab ASIC & Syst, Shanghai 201203, Peoples R China 5.Chengdu Technol Univ, Sch Elect Engn & Sch Microelect, Chengdu 611730, Peoples R China |
推荐引用方式 GB/T 7714 | Cai, Chang,Ning, Bingxu,Fan, Xue,et al. SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs[J]. SCIENCE CHINA-INFORMATION SCIENCES,2022,65(2):2. |
APA | Cai, Chang.,Ning, Bingxu.,Fan, Xue.,Liu, Tianqi.,Ke, Lingyun.,...&Liu, Jie.(2022).SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs.SCIENCE CHINA-INFORMATION SCIENCES,65(2),2. |
MLA | Cai, Chang,et al."SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs".SCIENCE CHINA-INFORMATION SCIENCES 65.2(2022):2. |
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