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CORC

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TID Response and Radiation-Enhanced Hot-Carrier Degradation in 65-nm nMOSFETs: Concerns on the Layout-Dependent Effects 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 8, 页码: 1565-1570
作者:  Ren, ZX (Ren, Zhexuan);  1An, X (An, Xia) 1;  Li, GS (Li, Gensong) 1;  Liu, JY (Liu, Jingyi) 1;  Xun, MZ (Xun, Mingzhu) 2
收藏  |  浏览/下载：43/0  |  提交时间：2021/09/22
The Impact of Self-Heating on HCI Reliability in High-Performance Digital Circuits 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Jiang, Hai; Shin, SangHoon; Liu, Xiaoyan; Zhang, Xing; Alam, Muhammad Ashraful
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
星用纳米MOS器件的总剂量辐射效应与NBTI效应研究 学位论文
硕士, 北京: 中国科学院大学, 2016
作者:  余德昭
收藏  |  浏览/下载：33/0  |  提交时间：2016/09/27
Accurate lifetime prediction for channel hot carrier stress on sub-1 nm equivalent oxide thickness HK/MG nMOSFET with thin titanium nitride capping layer 期刊论文
Microelectronics Reliability, 2016
作者:  Luo WC(罗维春);  Yang H(杨红);  Wang WW(王文武);  Zhu HL(朱慧珑);  Zhao C(赵超)
收藏  |  浏览/下载：14/0  |  提交时间：2017/05/09
Total dose responses and reliability issues of 65 nm NMOSFETs 期刊论文
Journal of Semiconductors, 2016, 卷号: 37, 期号: 6, 页码: 133-139
作者:  Yu DZ(余德昭);  Zheng QW(郑齐文);  Cui JW(崔江维);  Zhou H(周航);  Yu XF(余学峰)
收藏  |  浏览/下载：18/0  |  提交时间：2017/10/12
Hot-Carrier Effects on Total Dose Irradiated 65 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors 期刊论文
CHINESE PHYSICS LETTERS, 2016, 卷号: 33, 期号: 7
作者:  Zheng, QW (Zheng, Qi-Wen);  Cui, JW (Cui, Jiang-Wei);  Zhou, H (Zhou, Hang);  Yu, DZ (Yu, De-Zhao);  Yu, XF (Yu, Xue-Feng)
收藏  |  浏览/下载：25/0  |  提交时间：2016/12/07
Enhanced channel hot carrier effect of 0.13 mu m silicon-on-insulator N metal-oxide-semiconductor field-effect transistor induced by total ionizing dose effect 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 9
作者:  Zhou, H (Zhou Hang);  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Yu, XF (Yu Xue-Feng);  Guo, Q (Guo Qi)
收藏  |  浏览/下载：32/0  |  提交时间：2016/12/12
Reliability variability simulation methodology for IC design: An EDA perspective 其他
2016-01-01
Zhang, Aixi; Huang, Chunyi; Guo, Tianlei; Chen, Alvin; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Xie, Jushan
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Characterization of Self-heating Leads to Universal Scaling of HCI Degradation of Multi-Fin SOI FinFETs 其他
2016-01-01
Jiang, Hai; Shin, SangHoon; Liu, Xiaoyan; Zhang, Xing; Alam, Muhammad Ashraful
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Gate Engineering in SOI LDMOS for Device Reliability 其他
2016-01-01
Aanand; Sheu, Gene; Imam, Syed Sarwar; Lu, Shao Wei; Aryadeep, Chirag; Yang, Shao Ming
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03

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