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Analysis and Simulation of Low-Frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors 期刊论文
IEEE Journal of the Electron Devices Society, 2018, 卷号: 6, 期号: 1, 页码: 271-279
作者:  Liu, Yuan;  He, Hongyu;  Chen, Rongsheng*;  En, Yun-Fei;  Li, Bin
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/27
Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond 其他
2016-01-01
Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Deep understanding of random telegraph noise (RTN) effects on SRAM stability 其他
2016-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Luo, Mulong; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Deep Understanding of Random Telegraph Noise (RTN) Effects on SRAM Stability 其他
2016-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Luo, Mulong; Huang, Ru
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Predictive Compact Modeling of Random Variations in FinFET Technology for 16/14nm Node and Beyond 其他
2015-01-01
Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Compact Modeling of Random Telegraph Noise in Nanoscale MOSFETs and Impacts on Digital Circuits 其他
2014-01-01
Luo, Mulong; Wang, Runsheng; Wang, Jing; Guo, Shaofeng; Zou, Jibin; Huang, Ru
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Asymmetry study and improvement base on BSIM4 model (EI收录) 期刊论文
Huazhong Keji Daxue Xuebao (Ziran Kexue Ban)/Journal of Huazhong University of Science and Technology (Natural Science Edition), 2013, 卷号: 41, 页码: 102-105
作者:  Li, Bin[1];  Pan, Yuanzhen[1];  Xu, Yuebin[1]
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/25
基于粒子群优化算法的BSIM SOI模型参数提取 期刊论文
微电子学与计算机, 2013, 期号: [db:dc_citation_issue], 页码: 90-93
作者:  张国和;  郑雪;  陈克斌
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/10
一种辐照加固的500M锁相环设计 期刊论文
半导体技术, 2011
作者:  吕荫学
收藏  |  浏览/下载:4/0  |  提交时间:2012/11/15
一个带自热效应的新型LDMOS解析模型 期刊论文
2010, 2010
高雯; 杨东旭; 余志平; GAO Wen; YANG Dongxu; YU Zhiping
收藏  |  浏览/下载:3/0


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