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CORC

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Impact of within-wafer process variability on radiation response 期刊论文
MICROELECTRONICS JOURNAL, 2011, 卷号: 42, 期号: 6, 页码: 883-888
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10
High mobility compressive strained Si0.5Ge0.5 quantum well p-MOSFETs with higher-k/metal-gate 期刊论文
SOLID-STATE ELECTRONICS, 2011, 卷号: 62, 期号: 1, 页码: 185-188
Yu,W; Zhang,B; Zhao,QT; Hartmann,JM; Buca,D; Nichau,A; Luptak,R; Lopes,JMJ; Lenk,S; Luysberg,M; Bourdelle,KK; Wang,X; Mantl,S
收藏  |  浏览/下载：13/0  |  提交时间：2012/04/10
Hole tunneling from valence band and hot-carrier induced hysteresis effect in 0.13 mu m partially depleted silicon-on-insulator n-MOSFETs 期刊论文
MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 12, 页码: 2077-2080
Zhou,JH; Pang,A; Cao,S; Zou,SC
收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10
Low-temperature Au/a-Si wafer bonding 期刊论文
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2011, 卷号: 21, 期号: 1, 页码: 15013
Jing,ER; Xiong,B; Wang,YL
收藏  |  浏览/下载：8/0  |  提交时间：2012/04/12
New Thin-Film Multijunction Thermal Converter Based on P+ Polysilicon/Al Thermocouples 期刊论文
INTEGRATED FERROELECTRICS, 2011, 卷号: 128, 期号: 0, 页码: 8月13日
Han, JQ; Mao, CL; Zhong, Q; Li, Q; Yan, TH
收藏  |  浏览/下载：12/0  |  提交时间：2012/04/12
Fault detection, identification and reconstruction for gyroscope in satellite based on independent component analysis 期刊论文
ACTA ASTRONAUTICA, 2011, 卷号: 68, 期号: 7-8, 页码: 1015-1023
Li, ZZ; Liu, GH; Zhang, R; Zhu, ZC（朱振才）
收藏  |  浏览/下载：8/0  |  提交时间：2012/04/11
Temperature model for Ge2Sb2Te5 phase change memory in electrical memory device 期刊论文
SOLID-STATE ELECTRONICS, 2011, 卷号: 56, 期号: 1, 页码: 13-17
Cai,DL; Song,ZT; Chen,HP; Chen,XG
收藏  |  浏览/下载：14/0  |  提交时间：2012/04/10
Total ionizing dose effects in elementary devices for 180-nm flash technologies 期刊论文
MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 8, 页码: 1295-1301
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：16/0  |  提交时间：2012/04/10
The impact of total ionizing radiation on body effect 期刊论文
MICROELECTRONICS JOURNAL, 2011, 卷号: 42, 期号: 12, 页码: 1396-1399
Ning,BX; Hu,ZY; Zhang,ZX; Liu,ZL; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10
Comparison of TID response in core, input/output and high voltage transistors for flash memory 期刊论文
MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 6, 页码: 1148-1151
Liu,ZL; Hu,ZY; Zhang,ZX; Shao,H; Chen,M; Bi,DW; Ning,BX; Zou,SC
收藏  |  浏览/下载：8/0  |  提交时间：2012/04/10

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