The impact of total ionizing radiation on body effect

	The impact of total ionizing radiation on body effect
	Ning,BX ; Hu,ZY ; Zhang,ZX ; Liu,ZL ; Chen,M ; Bi,DW ; Zou,SC
刊名	MICROELECTRONICS JOURNAL
	2011
卷号	42 期号:12 页码:1396-1399
关键词	ELSEVIER SCI LTD
ISSN号	0026-2692
学科主题	Engineering ; Electrical & Electronic; Nanoscience & Nanotechnology
公开日期	2012-04-10
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/106807]
专题	上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式 GB/T 7714	Ning,BX,Hu,ZY,Zhang,ZX,et al. The impact of total ionizing radiation on body effect[J]. MICROELECTRONICS JOURNAL,2011,42(12):1396-1399.
APA	Ning,BX.,Hu,ZY.,Zhang,ZX.,Liu,ZL.,Chen,M.,...&Zou,SC.(2011).The impact of total ionizing radiation on body effect.MICROELECTRONICS JOURNAL,42(12),1396-1399.
MLA	Ning,BX,et al."The impact of total ionizing radiation on body effect".MICROELECTRONICS JOURNAL 42.12(2011):1396-1399.