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科研机构
兰州大学 [2]
兰州理工大学 [1]
内容类型
会议论文 [2]
期刊论文 [1]
发表日期
2012 [3]
学科主题
atomic and... [1]
classical ... [1]
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Role of melt processing in preparation of Mg-9Zn-2Al magnesium alloy semi-solid slurry
期刊论文
Zhongguo Youse Jinshu Xuebao/Chinese Journal of Nonferrous Metals, 2012, 卷号: 22, 期号: 6, 页码: 1536-1545
作者:
Li, Chun
;
Li, Yuan-Dong
;
Ma, Ying
;
Chen, Ti-Jun
;
Wu, Hui-Hui
收藏
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浏览/下载:0/0
  |  
提交时间:2020/11/14
Aluminum alloys
Atomic beams
Grain size and shape
Magnesium castings
Melting
Ternary alloys
Zinc alloys
Zinc castings
Atomic clusters
Average grain size
Derived formulae
Melt treatments
Self-inoculation methods
Semi-solid slurry
Solid phase ratio
Temperature range
Surface morphology and roughness of Cu thin films prepared by ionized cluster beam deposition
会议论文
2012 International Conference on Frontiers of Advanced Materials and Engineering Technology, FAMET 2012, Xiamen, China, January 4, 2012 - January 5, 2012
作者:
Cao, Bo
;
Yang, Tongrui
;
Li, Gongping
;
Cho, Seong Jin
;
Kim, Hee
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/01/20
Surface morphology
Atomic force microscopy
Chemical modification
Copper
Deposition
Engineering technology
Ionization
Ions
Morphology
Semiconducting silicon compounds
Surface roughness
Surfaces
Thin films
Vapor deposition
Acceleration voltages
Average grain size
Cu Films
Cu thin film
Deposition conditions
Ionized cluster beam deposition
Ionized cluster beams
P-type Si
XPS spectra of cu thin films prepared by ionized cluster beam deposition
会议论文
2nd International Symposium on Chemical Engineering and Material Properties, ISCEMP 2012, Taiyuan, Shanxi, China, June 22, 2012 - June 24, 2012
作者:
Cao, Bo
;
Yang, Tongrui
;
Li, Gongping
;
Cho, Seongjin
;
Kim, Hee
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/01/20
X ray photoelectron spectroscopy
Atoms
Binding energy
Chemical engineering
Chemical modification
Deposits
Ions
Photoelectrons
Silicon
Surface properties
Thin films
Vapor deposition
Atomic binding
Bulk materials
Copper films
Cu thin film
Ionized cluster beam deposition
Ionized cluster beams
Local energy
Neutral clusters
P-type Si
XPS spectra
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