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浏览/检索结果: 共8条，第1-8条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Changes in environmental flow regimes caused by tropical cyclones in the Western North Pacific 其他 2019-01-01 作者:  Kang, Ho-Young;  Kim, Jong-Suk;  Xiong, Lihua;  Lee, Joo-Heon 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/05 First foundry platform of complementary tunnel-FETs in CMOS baseline technology for ultralow-power IoT applications: Manufacturability, variability and technology roadmap 其他 2016-01-01 Huang, Qianqian; Jia, Rundong; Chen, Cheng; Zhu, Hao; Guo, Lingyi; Wang, Junyao; Wang, Jiaxin; Wu, Chunlei; Wang, Runsheng; Bu, Weihai; Kang, Jing; Wang, Wenbo; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 First Foundry Platform of Complementary Tunnel-FETs in CMOS Baseline Technology for Ultralow-Power IoT Applications: Manufacturability, Variability and Technology Roadmap 其他 2015-01-01 Huang, Qianqian; Jia, Rundong; Chen, Cheng; Zhu, Hao; Guo, Lingyi; Wang, Junyao; Wang, Jiaxin; Wu, Chunlei; Wang, Runsheng; Bu, Weihai; Kang, Jing; Wang, Wenbo; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 TRANSISTORS   Local accumulated free carriers in charge trapping memory 其他 2008-01-01 Song, Y.C.; Liu, X.Y.; Zhaol, K.; Kang, J.F.; Han, R.Q.; Xia, Z.L.; Kim, D.; Lee, K.-H. 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10 Evaluating the effects of physical mechanisms on the program, erase and retention in the charge trapping memory 其他 2008-01-01 Song, Y.C.; Liu, X.Y.; Wang, Z.Y.; Zhao, K.; Du, G.; Kang, J.F.; Han, R.Q.; Xia, Z.L.; Kim, D.; Lee, K.-H. 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10 Evaluating the Effects of Physical Mechanisms on the Program, Erase and Retention in the Charge Trapping Memory 其他 2008-01-01 Song, Y. C.; Liu, X. Y.; Wang, Z. Y.; Zhao, K.; Du, G.; Kang, J. F.; Han, R. Q.; Xia, Z. L.; Kim, D.; Lee, K-H 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 Charge Trapping Memory  Non-volatile Memory  Simulation of Programming/Erasing/Retention Characteristics   Local Accumulated Free Carriers in Charge Trapping Memory 其他 2008-01-01 Song, Y. C.; Liu, X. Y.; Zhao, K.; Kang, J. F.; Han, R. Q.; Xia, Z. L.; Kim, D.; Lee, K-H 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 SILICON-NITRIDE  DIOXIDE   Strain-induced very low noise RF MOSFETs on flexible plastic substrate 其他 2005-01-01 Kao, H.L.; Chin, Albert; Hung, B.F.; Lai, J.M.; Lee, C.F.; Li, M.-F.; Samudra, G.S.; Zhu, C.; Xia, Z.L.; Liu, X.Y.; Kang, J.F. 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13