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Strain-induced very low noise RF MOSFETs on flexible plastic substrate
Kao, H.L. ; Chin, Albert ; Hung, B.F. ; Lai, J.M. ; Lee, C.F. ; Li, M.-F. ; Samudra, G.S. ; Zhu, C. ; Xia, Z.L. ; Liu, X.Y. ; Kang, J.F.
2005
英文摘要Using microstrip line design to screen substrate resistance generated RF noise, very low 1. l dB min. noise figure (NFmin) and high 12 dB associate gain are measured at 10 GHz of 0.18 ??m MOSFET on plastic without de-embedding. The die on plastic was thinned to 30??m that allows applying uniaxial strain to further lower the 10 GHz NFmin to only 0.92 dB and comparable well with the 0.13 ??m and 90nm nodes MOSFETs.; EI; 0
语种英语
DOI标识10.1109/.2005.1469251
内容类型其他
源URL[http://ir.pku.edu.cn/handle/20.500.11897/328895]  
专题信息科学技术学院
推荐引用方式
GB/T 7714
Kao, H.L.,Chin, Albert,Hung, B.F.,et al. Strain-induced very low noise RF MOSFETs on flexible plastic substrate. 2005-01-01.
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