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CORC

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Impact of within-wafer process variability on radiation response 期刊论文
MICROELECTRONICS JOURNAL, 2011, 卷号: 42, 期号: 6, 页码: 883-888
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10
Comprehensive Study on the Total Dose Effects in a 180-nm CMOS Technology 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1347-1354
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：15/0  |  提交时间：2012/04/10
Simple Method for Extracting Effective Sheet Charge Density Along STI Sidewalls Due to Radiation 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1332-1337
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：8/0  |  提交时间：2012/04/10
Total Ionizing Dose Enhanced DIBL Effect for Deep Submicron NMOSFET 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1324-1331
Liu,ZL; Hu,ZY; Zhang,ZX; Shao,H; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：13/0  |  提交时间：2012/04/10
Total ionizing dose effects in elementary devices for 180-nm flash technologies 期刊论文
MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 8, 页码: 1295-1301
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：16/0  |  提交时间：2012/04/10
Radiation Hardening by Applying Substrate Bias 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1355-1360
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：15/0  |  提交时间：2012/04/10
The impact of total ionizing radiation on body effect 期刊论文
MICROELECTRONICS JOURNAL, 2011, 卷号: 42, 期号: 12, 页码: 1396-1399
Ning,BX; Hu,ZY; Zhang,ZX; Liu,ZL; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10
Comparison of TID response in core, input/output and high voltage transistors for flash memory 期刊论文
MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 6, 页码: 1148-1151
Liu,ZL; Hu,ZY; Zhang,ZX; Shao,H; Chen,M; Bi,DW; Ning,BX; Zou,SC
收藏  |  浏览/下载：8/0  |  提交时间：2012/04/10
Effect of nanoclusters induced by Si implantation on total dose radiation response of a SOI wafer 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 1, 页码: 15015-15015
Wu,AM; Chen,J; Zhang,EX; Wang,X; Zhang,ZX
收藏  |  浏览/下载：12/0  |  提交时间：2012/03/24
Ge condensation characterization of SiGe-On-Insulator structure fabricated by separation of oxygen implantation 期刊论文
2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS, 2004, 期号: 0, 页码: 2187-2189
Chen,ZJ; Zhang,F; Zhang,ZX; Bo,J; Wang,X; Zou,SC
收藏  |  浏览/下载：8/0  |  提交时间：2012/03/24

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