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Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam 期刊论文
SPRINGER PROCEEDINGS IN PHYSICS, 2018, 卷号: 212, 页码: 113-116
作者:  Wen KL(温凯乐);  Liu SL(刘术林);  Yan BJ(闫保军);  Wen, Kaile;  Liu, Shulin
收藏  |  浏览/下载:37/0  |  提交时间:2019/09/24
A new design for secondary electron measurement and application 期刊论文
SPRINGER PROCEEDINGS IN PHYSICS, 2018, 卷号: 213, 页码: 225-232
作者:  Yan BJ(闫保军);  Li, Jinhai;  Yan, Baojun;  Liu SL(刘术林);  Liu, Shulin
收藏  |  浏览/下载:11/0  |  提交时间:2019/09/24
Secondary electron yield of nano-thick aluminum oxide and its application on MCP detector 期刊论文
SPRINGER PROCEEDINGS IN PHYSICS, 2018, 卷号: 213, 页码: 339-343
作者:  Zhao TC(赵天池);  Wang PL(王佩良);  Heng, Yuekun;  Wang, Peiliang;  Zhao, Tianchi
收藏  |  浏览/下载:40/0  |  提交时间:2019/09/24


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