Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam | |
Wen KL(温凯乐); Liu SL(刘术林)![]() ![]() ![]() ![]() | |
刊名 | SPRINGER PROCEEDINGS IN PHYSICS
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2018 | |
卷号 | 212页码:113-116 |
ISSN号 | 0930-8989 |
DOI | 10.1007/978-981-13-1313-4_23 |
文献子类 | Proceedings Paper |
英文摘要 | In order to improve the performance of the microchannel plate, a material having a high secondary electron emission coefficient (SEEC) is required, and the SEEC of this material needs to be accurately measured. For this purpose, a SEEC measuring device with spherical collector structure was designed. The device consists of vacuum system, electron gun, main chamber, sample stage, test system and test software. The measurement of the SEEC from a wide incident energy range (100 eV–10 keV) and a large incident angle (0°–85°) is realized by using the pulsed electron beam as the incident electron. The energy distribution of the secondary electrons is measured by a multi-layer grid structure. The SEEC of the metallic material was tested by using this device, which proves that the device is stable and good. © 2018, Springer Nature Singapore Pte Ltd. |
电子版国际标准刊号 | 1867-4941 |
会议地点 | Beijing, China |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://ir.ihep.ac.cn/handle/311005/286575] ![]() |
专题 | 高能物理研究所_实验物理中心 高能物理研究所_多学科研究中心 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Wen KL,Liu SL,Yan BJ,et al. Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam[J]. SPRINGER PROCEEDINGS IN PHYSICS,2018,212:113-116. |
APA | 温凯乐.,刘术林.,闫保军.,Wen, Kaile.,Liu, Shulin.,...&Yang, Yuzhen.(2018).Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam.SPRINGER PROCEEDINGS IN PHYSICS,212,113-116. |
MLA | 温凯乐,et al."Spherical measuring device of secondary electron emission coefficient based on pulsed electron beam".SPRINGER PROCEEDINGS IN PHYSICS 212(2018):113-116. |
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