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MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal Probes for Wafer-Level IC Testing 期刊论文
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2009, 卷号: 18, 期号: 4, 页码: 933-941
Wang, F; Cheng, R; Li, XX
收藏  |  浏览/下载：8/0  |  提交时间：2011/12/17
MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal Probes for Wafer-Level IC Testing 期刊论文
IEEE JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2009, 卷号: 18, 期号: 10.1155/2011/654715 Published, 页码: 933-941
Wang, F; Cheng, R; Li, XX
收藏  |  浏览/下载：5/0  |  提交时间：2012/05/12
MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal Probes for Wafer-Level IC Testing 期刊论文
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2009, 卷号: 18, 期号: 4, 页码: 933-941
Wang, F; Cheng, R; Li, XX
收藏  |  浏览/下载：8/0  |  提交时间：2011/12/17
Two-dimensional dense-arrayed probe-cards with a hoe-shaped probing-tip micromachining technique 期刊论文
MEMS 2008: 21ST IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 2008, 页码: 343-346
Wang, F; Li, XX; Cheng, R; Yang, H; Wang, YL; Feng, SL; Ge, XH; Chen, T; Chen, LG; Sun, LN
收藏  |  浏览/下载：13/0  |  提交时间：2011/12/17
A MEMS probe card with 2D dense-arrayed 'hoe'-shaped metal tips 期刊论文
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2008, 卷号: 18, 期号: 5, 页码: 55008-55008
Wang, F; Li, XX; Feng, SL
收藏  |  浏览/下载：7/0  |  提交时间：2011/12/17
Two-dimensional dense-arrayed probe-cards with a hoe-shaped probing-tip micromachining technique 期刊论文
MEMS 2008: 21ST IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 2008, 页码: 343-346
Wang,F; Li,XX; Cheng,R; Yang,H; Wang,YL; Feng,SL; Ge,XH; Chen,T; Chen,LG; Sun,LN
收藏  |  浏览/下载：7/0  |  提交时间：2011/12/17
MEMS Vertical Probe Cards with Both Line-arrayed and Area-arrayed Ultra-dense Metal Tips for Wafer-level IC Testing 期刊论文
IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2008, TECHNICAL DIGEST, 2008, 页码: 503-506
Wang, F; Cheng, R; Li, XX
收藏  |  浏览/下载：15/0  |  提交时间：2011/12/17
A MEMS probe card with 2D dense-arrayed 'hoe'-shaped metal tips 期刊论文
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2008, 卷号: 18, 期号: 6 Pages, 页码: 055008
Wang, F; Li, XX; Feng, SL ,
收藏  |  浏览/下载：7/0  |  提交时间：2012/05/12
Two-Dimensional Dense-Arrayed Probe-Cards With A Hoe-Shaped Probing-Tip Micromachining Technique 会议论文
IEEE MEMS 2008:21th IEEE International Conference on Micro Electro Mechanical Systems, 2008
Fei Wang, Xinxin Li, Songlin Feng, Tao Chen, Liguo Chen and Lining Sun
收藏  |  浏览/下载：15/0  |  提交时间：2012/05/04
MEMS Vertical Probe Cards with Both Line-arrayed and Area-arrayed Ultra-dense Metal Tips for Wafer-level IC Testin 会议论文
IEDM 2008:54thIEEE International Electron Device Meeting, 2007
Fei Wang, Rong Cheng, Xinxin Li
收藏  |  浏览/下载：17/0  |  提交时间：2012/05/04

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