CORC

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CORC

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Conditional fault-tolerant edge-bipancyclicity of hypercubes with faulty vertices and edges 其他
2016-01-01
Yang, Da-Wei; Gu, Mei-Mei
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Controllable Growth and On-Site Domain Boundary Imaging of Monolayer Mo S2 on Au Foils and Its Potential Application in Hydrogen Evolution Reaction 其他
2015-01-01
Jianping Shi; Yanfeng Zhang; Zhongfan Liu
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Investigations on the Correlation between Line-edge-roughness (LER) and Line-width-roughness (LWR) in Nanoscale CMOS Technology 其他
2012-01-01
Jiang, Xiaobo; Li, Meng; Wang, Runsheng; Chen, Jiang; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
The heuristic algorithm of stacking layer for the three-dimensional packing of fixed-size cargoes 其他
2012-01-01
Liu, Wang-Sheng; Yin, Hua-Yi; Li, Mao-Qing; 李茂青
收藏  |  浏览/下载：6/0  |  提交时间：2015/07/22
Vision-based deformation measurement of loaded Three-Ring Chain 其他
2012-01-01
Peng, Yin; Wang, Lei; Jiang, Xiaofeng; Zhang, Fengling; Xiao, Guixiang; 王磊
收藏  |  浏览/下载：3/0  |  提交时间：2015/07/22
Simulation of Line-Edge Roughness Effects in Silicon Nanowire MOSFETs 其他
2010-01-01
Yu, Tao; Wang, Runsheng; Huang, Ru
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13
RETRACTED ARTICLE: Practical algorithm for shortest path on large networks with time-dependent edge-length 其他
2010-01-01
Jigang, Wu; Han, Pingliang; Jagadeesh, George Rosario; Srikanthan, Thambipillai
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13
Triple-Gate Fin Field Effect Transistors with Fin-Thickness Optimization to Reduce the Impact of Fin Line Edge Roughness 其他
2009-01-01
Yu, Shimeng; Zhao, Yuning; Du, Gang; Kang, Jinfeng; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
Effect of Channel Length on NBTI in Sub-100nm CMOS Technology 其他
2008-01-01
Jin, Lei; Xu, Mingzhen
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/10
Impact of Stochastic Mismatch on FinFETs SRAM Cell Induced by Process Variation 其他
2008-01-01
Yu, Shimeng; Zhao, Yuning; Du, Gang; Kang, Jinfeng; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：9/0  |  提交时间：2015/11/10

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