×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
半导体研究所 [11]
内容类型
会议论文 [6]
期刊论文 [5]
发表日期
2010 [1]
2008 [2]
2006 [2]
2005 [1]
2003 [1]
2001 [1]
更多...
学科主题
光电子学 [11]
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共11条,第1-10条
帮助
限定条件
学科主题:光电子学
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 7, 页码: art. no. 076804
Guo X (Guo Xi)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Jiang DS (Jiang De-Sheng)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Wang H (Wang Hui)
;
Zhang SM (Zhang Shu-Ming)
;
Qiu YX (Qiu Yong-Xin)
;
Xu K (Xu Ke)
;
Yang H (Yang Hui)
收藏
  |  
浏览/下载:67/0
  |  
提交时间:2010/08/17
in-plane grazing incidence x-ray diffraction
gallium nitride
mosaic structure
biaxial strain
CHEMICAL-VAPOR-DEPOSITION
LATTICE-CONSTANTS
ALN
Characteristics of SOI rib waveguide microring and racetrack resonators
会议论文
5th ieee international conference on group iv photonics, sorrento, italy, sep 17-19, 2008
Huang, QZ
;
Xiao, X
;
Li, YT
;
Yu, YD
;
Yu, JZ
收藏
  |  
浏览/下载:61/0
  |  
提交时间:2010/03/09
Resonators
submicron rib waveguides
silicon-on-insulator
electron beam lithography
Native deep level defects in ZnO single crystal grown by CVT method - art. no. 68410I
会议论文
conference on solid state lighting and solar energy technologies, beijing, peoples r china, nov 12-14, 2007
Zhao, YW
;
Zhang, F
;
Zhang, R
;
Dong, ZY
;
Wei, XC
;
Zeng, YP
;
Li, JM
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2010/03/09
zinc oxide
defect
vacancy
Optical properties of semiconductor quantum-well material using photonic crystal fabricated by micro-fabrication machine
期刊论文
acta physica sinica, 2006, 卷号: 55, 期号: 3, 页码: 1248-1252
Xu XS
;
Xiong ZG
;
Sun ZH
;
Du W
;
Lu L
;
Chen HD
;
Jin AZ
;
Zhang DZ
收藏
  |  
浏览/下载:81/0
  |  
提交时间:2010/04/11
focused ion beam
electron beam lithography
photonic crystal
extraction efficiency
LIGHT EXTRACTION
SLAB
Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction
期刊论文
materials science and engineering b-solid state materials for advanced technology, 2006, 卷号: 133, 期号: 1-3, 页码: 117-123
Zhao HQ (Zhao Hong-Quan)
;
Yu LJ (Yu Li-Juan)
;
Huang YZ (Huang Yong-Zhen)
;
Wang YT (Wang Yu-Tian)
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2010/04/11
InP
Si
X-ray double crystalline diffraction
thermal strain
wafer bonding
OPTOELECTRONIC DEVICES
EPITAXIAL OVERGROWTHS
TEMPERATURE
INTERFACE
STRESSES
VCSELS
SURFACES
ENERGY
Leakage current analysis in AlGaInP/GaInP multi-quantum well lasers by the electrical derivative method - art. no. 60202F
会议论文
conference on optoelectronic materials and devices for optical communications, shanghai, peoples r china, nov 07-10, 2005
Xu Y
;
Li YZ
;
Song GF
;
Gan QQ
;
Cao Q
;
Guo L
;
Chen LH
收藏
  |  
浏览/下载:108/26
  |  
提交时间:2010/03/29
AIGaInP laser diodes
Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers
期刊论文
半导体学报, 2003, 卷号: 24, 期号: 8, 页码: 789-793
作者:
Yu Lijuan
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2010/11/23
Si-based resonant-cavity-enhanced photodetector
期刊论文
optical engineering, 2001, 卷号: 40, 期号: 7, 页码: 1192-1194
Wang QM
;
Li C
;
Cheng BW
;
Yang QQ
收藏
  |  
浏览/下载:95/4
  |  
提交时间:2010/08/12
RCE photodetector
SlGe/Si
SIMOX
Bragg reflector
top-illumination
bottom-illumination
responsivity spectra
SiGe/Si quantum well resonant-cavity-enhanced photodetector
会议论文
conference on terahertz and gigahertz electronics and photonics ii, san diego, ca, jul 31-aug 02, 2000
Li C
;
Yang QQ
;
Wang HJ
;
Zhu JL
;
Luo LP
;
Yu JZ
;
Wang QM
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2010/10/29
RCE photodetector
SiGe/Si
SIMOX
Bragg reflector
A model of dislocations at the interface of the bonded wafers
会议论文
conference on optical interconnects for telecommunication and data communications, beijing, peoples r china, nov 08-10, 2000
作者:
Han WH
;
Wang LC
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2010/10/29
wafer bonding
heteroepitaxy
lattice mismatch
edge-like dislocations
thermal stress
60 degrees dislocation lines
GAAS
©版权所有 ©2017 CSpace - Powered by
CSpace