QQ客服 官方微博 反馈留言

浏览/检索结果: 共4条，第1-4条 帮助 限定条件 发表日期：2013     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part I-Modeling and Simulation Method 期刊论文 ieee电子器件汇刊, 2013 Jiang, Xiaobo; Wang, Runsheng; Yu, Tao; Chen, Jiang; Huang, Ru 收藏  |  浏览/下载：11/0  |  提交时间：2015/11/10 Auto-correlation function  cross-correlation  line-edge-roughness (LER)  line-width-roughness (LWR)  modeling  variability  INTRINSIC PARAMETER FLUCTUATIONS  VARIABILITY  MOSFETS  DECANANOMETER  PERFORMANCE   Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part II-Experimental Results and Impacts on Device Variability 期刊论文 ieee电子器件汇刊, 2013 Wang, Runsheng; Jiang, Xiaobo; Yu, Tao; Fan, Jiewen; Chen, Jiang; Pan, David Z.; Huang, Ru 收藏  |  浏览/下载：7/0  |  提交时间：2015/11/10 FinFET  line-edge roughness (LER)  line-width roughness (LWR)  nanowire  variability  INTRINSIC PARAMETER FLUCTUATIONS  FINFET MATCHING PERFORMANCE  MOSFETS  DECANANOMETER  NANOWIRES  OXIDATION  NOISE   Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX 期刊论文 ieee电子器件汇刊, 2013 Yang, Yunxiang; Markov, Stanislav; Cheng, Binjie; Zain, Anis Suhaila Mohd; Liu, Xiaoyan; Asenov, Asen 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 Back-gate bias  line edge roughness (LER)  metal gate granularity (MGG)  random dopant fluctuation (RDF)  statistical variability (SV)  thin buried oxide (BOX)  INTRINSIC PARAMETER FLUCTUATIONS  SIMULATION  DECANANOMETER  IMPACT   Simulation of correlated line-edge roughness in multi-gate devices 其他 2013-01-01 Jiang, Xiaobo; Wang, Runsheng; Huang, Ru; Chen, Jiang 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13