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Influence of buffer layer thickness and epilayer's growth temperature on crystalline quality of InAs0.6P0.4InP grown by LP-MOCVD 期刊论文
Solid State Communications, 2011, 卷号: 151, 期号: 12, 页码: 904-907
Liu X.; Song H.; Miao G.; Jiang H.; Cao L.; Sun X.; Li D.; Chen Y.; Li Z.
收藏  |  浏览/下载:19/0  |  提交时间:2012/10/21
Influence of buffer layer thickness and epilayer's growth temperature on crystalline quality of InAs0.6P0.4/Inp grown by LP-MOCVD 期刊论文
Solid State Communications, 2011, 卷号: 151, 期号: 12, 页码: 904-907
Liu X.; Song H.; Miao G. Q.; Jiang H.; Cao L. Z.; Sun X. J.; Li D. B.; Chen Y. R.; Li Z. M.
收藏  |  浏览/下载:12/0  |  提交时间:2012/10/21
Influence of thermal annealing duration of buffer layer on the crystalline quality of In0.82Ga0.18As grown on InP substrate by LP-MOCVD 期刊论文
Applied Surface Science, 2011, 卷号: 257, 期号: 6, 页码: 1996-1999
Liu X.; Song H.; Miao G. Q.; Jiang H.; Cao L. Z.; Li D. B.; Sun X. J.; Chen Y. R.
收藏  |  浏览/下载:13/0  |  提交时间:2012/10/21


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