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Impacts of Metastable Defect States on Gate Oxide Trapping in Nanoscale MOS Devices 其他
2016-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Liu, Changze
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
Thermal Stability Improvement of Nickel Germanide Utilizing Nitrogen Plasma Pretreatment for Germanium-Based Technology 其他
2016-01-01
Zhang, Bingxin; An, Xia; Liu, Pengqiang; Li, Ming; Lin, Meng; Hao, Peilin; Zhang, Xing; Huang, Ru
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
Later Passages of Neural Progenitor Cells from Neonatal Brain Are More Permissive for Human Cytomegalovirus Infection (vol 87, pg 10968, 2013) 其他
2016-01-01
作者:  Pan, Xing;  Li, Xiao-Jun;  Liu, Xi-Juan;  Yuan, Hui;  Li, Jia-Fu
收藏  |  浏览/下载：4/0  |  提交时间：2019/12/05
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他
2015-01-01
Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
N+/P shallow junction with high dopant activation and low contact resistivity fabricated by solid phase epitaxy method for Ge technology 其他
2015-01-01
Liu, Pengqiang; Li, Ming; An, Xia; Lin, Meng; Zhao, Yang; Zhang, Bingxin; Xia, Xuyuan; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
On the origin of frequency dependence of single-trap induced degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Understanding NBTI-induced dynamic variability in the nano-reliability Era: From devices to circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Understanding NBTI-induced Dynamic Variability in the nano-Reliability Era: from Devices to Circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
On the Origin of Frequency Dependence of Single-Trap Induced Degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03

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