QQ客服 官方微博 反馈留言

浏览/检索结果: 共3条，第1-3条 帮助 限定条件 发表日期：2009     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Optical system of large relative aperture and wide field using aspheric corrector for detecting (EI CONFERENCE) 会议论文 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008, Chengdu, China Ming M.; Wang J.; Zhang J. 收藏  |  浏览/下载：16/0  |  提交时间：2013/03/25 The magnitude requirement of space target detecting determines that the image of detecting telescope should have several performances: small spots  the wider field of view  small 80% encircled energy diameter and good MTF(Modulation transfer function). So the aperture and field of view of optical system have some demands accordingly. The larger aperture  the more extensive range which the telescope searches. Now most of ground telescopes whose apertures are from 500mm to 1000mm is on-axis optical system  the more energy that telescope collects and higher magnitude the telescope detects  so wide field of view becomes the most importance problem. To obtain large relative aperture and wide field of view  the paper introduces a catadioptric telescope with small aperture aspheric refractive corrector  whose conic surface will be used to remove the aberrations due to large relative aperture and wide field of view. As to the optical system  there is only one aspheric refractive corrector  and it is relatively easy for manufacturing because of its concave figure and normal material. The paper gives the example  and optimizes this optical system with ZEMAX program. And then the paper provides a specific analysis program for testing the aspheric refractive corrector. The aperture of this optical system is 750mm  and its relative aperture is 0.82  and the field of view is 3.6 diameter(diagonal). Its structure is simple and the image quality is also very good. 2009 SPIE.   Design and tolerance analysis of compensator for high order aspheric surface testing (EI CONFERENCE) 会议论文 2009 International Conference on Optical Instruments and Technology - Optoelectronic Measurement Technology and Systems, October 19, 2009 - October 22, 2009, Shanghai, China Chen X.; Liu W.; Kang Y.; Wei Z. 收藏  |  浏览/下载：19/0  |  提交时间：2013/03/25 High accuracy is required in surface testing of 90nm nodal point lithography projecting lens. By comparing various aspheric surface testing methods  the structure layout of the compensator is a meniscus positive lens combined with a Plano-convex positive lens. The design results indicate that: primary and high order aberrations are balanced well  we adopt Offner null compensator to test the aspheric surface in the point diffraction interferometer at last. In this paper  MTF exceeds diffraction limit  an Offner compensator is presented on the base of the third order aberration theory to test concave aspheric surface  root-mean-square (RMS) of wave front error /167. The F-number of the system can achieve F/1.64. By the analysis of the process of aspheric surface testing with the designed system  the optical construction parameters of which is determined by introducing equal-quantities spherical aberration to compensate all orders of aspheric coefficients. The field of view of the system is 0.02  a loosen distribution of the tolerance was presented based on the accuracy of measuring apparatus. 2009 SPIE.   高精度光学元件微电铸技术研究 学位论文 2009, 2009 李洪友 收藏  |  浏览/下载：3/0  |  提交时间：2016/02/14 微电铸  双向脉冲电流  高精光学元件  微光学非球面  Micro Electroforming  Bipolar pulse current  High Precision Optics  Micro Optical Aspheric Surface