QQ客服 官方微博 反馈留言

浏览/检索结果: 共3条，第1-3条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Near-field microscopy inspection of nano scratch defects on the monocrystalline silicon surface 期刊论文 PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2019, 卷号: 56, 页码: 506-512 作者:  Yan, Ying;  Wang, Yonghao;  Zhou, Ping;  Huang, Ning;  Guo, Dongming 收藏  |  浏览/下载：20/0  |  提交时间：2019/12/02 s-SNOM  Surface defects  Micro crack   Near-field microscopy inspection of nano scratch defects on the monocrystalline silicon surface 期刊论文 Precision Engineering, 2019 作者:  Ying Yan;  Yonghao Wang;  Ping Zhou;  Ning Huang;  Dongming Guo 收藏  |  浏览/下载：10/0  |  提交时间：2019/12/13 s-SNOM  surface defects  micro crack   Effects of edge on graphene plasmons as revealed by infrared nanoimaging 期刊论文 LIGHT-SCIENCE & APPLICATIONS, 2017, 卷号: 6, 页码: - Xu, Qingyang; Ma, Teng; Danesh, Mohammad; Shivananju, Bannur Nanjunda; Gan, Sheng; Song, Jingchao; Qiu, Cheng-Wei; Cheng, Hui-Ming; Ren, Wencai; Bao, Qiaoliang 收藏  |  浏览/下载：42/0  |  提交时间：2017/08/17 edge chirality  graphene  graphene plasmon  nanoribbon  nanogap  near-field microscopy  s-SNOM