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Electrical and Thermal Transport Properties of n-type Bi6Cu2Se4O6 (2BiCuSeO+2Bi(2)O(2)Se) 期刊论文
ANNALEN DER PHYSIK, 2019
作者:  Zhang, Xiaoxuan;  Qiu, Yuting;  Ren, Dudi;  Zhao, Li-Doug
收藏  |  浏览/下载：150/0  |  提交时间：2019/12/31
Common Workspace Analysis for a Dual-Arm Robot Based on Reachability 会议论文
2017 IEEE INTERNATIONAL CONFERENCE ON CYBERNETICS AND INTELLIGENT SYSTEMS (CIS) AND IEEE CONFERENCE ON ROBOTICS, AUTOMATION AND MECHATRONICS (RAM), 2017-01-01
作者:  Liu, Qinghua[1];  Chen, Chin-Yin[2];  Wang, Chongchong[3];  Wang, Wen[4]
收藏  |  浏览/下载：8/0  |  提交时间：2019/04/24
Chevrel Phase MoT as Electrodes for Advanced Energy Storage 期刊论文
Small, 2017, 卷号: Vol.13 No.34
作者:  Mei, L.;  Xu, J.;  Wei, Z.;  Liu, H.;  Li, Y.
收藏  |  浏览/下载：1/0  |  提交时间：2019/12/31
Chevrel Phase Mo6 T8 (T = S, Se) as Electrodes for Advanced Energy Storage. 期刊论文
Small, 2017
作者:  Mei, Lin;  Xu, Jiantie;  Wei, Zengxi;  Liu, Huakun;  Li, Yutao
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/31
Sr_5Al_2Sb_6和CuInX_2(X=S,Se,Te)的热电性质的理论研究 学位论文
: 河南大学, 2016
作者:  叶灵云[1]
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/23
Investigation on Sb-rich Sb-Se-Te phase-change material for phase change memory application 期刊论文
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2012, 卷号: 358, 期号: 17, 页码: 2409-2411
Wu, LC; Zhu, M; Song, ZT; Lv, SL; Zhou, XL; Peng, C; Rao, F; Song, SN; Liu, B; Feng, SL
收藏  |  浏览/下载：17/0  |  提交时间：2013/04/17
Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
Jin W.; Jin C.; Zhu H.; Liu L.; Yang H.
收藏  |  浏览/下载：20/0  |  提交时间：2013/03/25
Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.  
SeH和Se~2H分子基态（X~2Ⅱ）及SeH~-离子基态（X~1∑）的结构与势能函数 期刊论文
四川大学学报(自然科学版), 2007, 卷号: 第44卷, 页码: P101-105
作者:  沈光先;  令狐荣锋
收藏  |  浏览/下载：1/0  |  提交时间：2019/02/28
Molten salt synthesis, crystal structure and optical properties of a novel quaternary metal selenide, K(2)Agln(3)Se(6) 期刊论文
中国化学英文版, 2004
Guo, HY; Wang, ZX; Shu, GM; Wang, RJ; Zhang, LD; Wang, P
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/16
[(enH)2(enH2)Sn2Se6]的合成,结构及性能研究 期刊论文
化学学报, 2003
韩克飞; 夏芸; 魏永革; 郭洪猷
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/12

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