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	Temporal Pattern-Aware QoS Prediction via Biased Non-Negative Latent Factorization of Tensors 期刊论文 IEEE TRANSACTIONS ON CYBERNETICS, 2020, 卷号: 50, 期号: 5, 页码: 1798-1809 作者: Luo, Xin; Wu, Hao; Yuan, Huaqiang; Zhou, MengChu 收藏 \| 浏览/下载：16/0 \| 提交时间：2020/08/24 Quality of service Hidden Markov models Data models Training Web services Time factors Latent factor analysis (LFA) latent factorization of tensor learning temporal pattern linear bias (LB) non-negative latent factorization of tensor non-negativity constraint quality-of-service (QoS) prediction
	Corrigendum: Effect of perceived negative workplace gossip on employees' behaviors [Front. Psychol., 9, 1112, (2018)] doi: 10.3389/fpsyg.2018.01112 期刊论文 Frontiers in Psychology, 2019, 卷号: 9, 期号: JAN 作者: Kong M. 收藏 \| 浏览/下载：28/0 \| 提交时间：2019/12/11 Hostile attribution bias In-role behavior Organization-based self-esteem Organizational citizenship behavior Perceived insider status Perceived negative workplace gossip
	Effect of Perceived Negative Workplace Gossip on Employees' Behaviors (vol 9, pg 1112, 2018) 期刊论文 FRONTIERS IN PSYCHOLOGY, 2019, 卷号: 9 作者: Kong, Ming 收藏 \| 浏览/下载：11/0 \| 提交时间：2019/12/11 perceived negative workplace gossip in-role behavior organizational citizenship behavior organization-based self-esteem perceived insider status hostile attribution bias
	Trap-Related Nonvolatile Negative Photoconductivity in a Single Ag@Al2O3 Hybrid Nanorod for a Photomemory with Light-Writing and Bias-Erasing 期刊论文 ADVANCED OPTICAL MATERIALS, 2019 作者: Ji, Wenwen; Zhou, Huiying*; Ye, Yalong; Zhao, Jie; Xiao, Yanhe 收藏 \| 浏览/下载：9/0 \| 提交时间：2019/12/28 bias erasing hybrid nanostructures light writing negative photoconductivity photomemory
	An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure 会议论文作者: Huang, Yang; Li, Binhong; Zhao, Xing; Zheng, Zhongshan; Gao, Jiantou 收藏 \| 浏览/下载：16/0 \| 提交时间：2019/11/26 Coupling effect double SOI (DSOI) negative back-gate bias total ionizing dose (TID)
	Negative magnetization and zero-field cooled exchange bias effect in Eu0.9Pr0.1CrO3 ceramics 期刊论文 PHYSICA B-CONDENSED MATTER, 2018, 卷号: 530, 页码: 95-100 作者: Huang, Ping[1]; Deng, Dongmei[2]; Zheng, Jiashun[3]; Li, Qing[4]; Feng, Zhenjie[5] 收藏 \| 浏览/下载：18/0 \| 提交时间：2019/04/24 Perovskite Canted antiferromagnetism Zero-field cooled exchange bias Negative magnetization Magnetic inhomogeneity
	Enhanced Electrical Performance and Negative Bias Illumination Stability of Solution-Processed InZnO Thin-Film Transistor by Boron Addition 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 520-525 作者: Zhong, De-Yao[1]; Li, Jun[2]; Zhao, Cheng-Yu[3] 收藏 \| 浏览/下载：4/0 \| 提交时间：2019/04/24 B doping concentration boron-doped indium-zinc-oxide (BIZO) thin-film transistors (TFTs) negative bias illumination stress (NBIS) stability solution process
	Effect of Perceived Negative Workplace Gossip on Employees' Behaviors 期刊论文 FRONTIERS IN PSYCHOLOGY, 2018, 卷号: 9 作者: Kong, Ming 收藏 \| 浏览/下载：5/0 \| 提交时间：2019/12/11 perceived negative workplace gossip in-role behavior organizational citizenship behavior organization-based self-esteem perceived insider status hostile attribution bias
	A Fast Vth Measurement Technique for NBTI Behavior Characterization. 期刊论文 IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175 作者: Yu, Xiao; Cheng, Ran; Liu, Wei; Qu, Yiming; Han, Jinghui 收藏 \| 浏览/下载：6/0 \| 提交时间：2019/12/26 Logic gates NBTI Negative bias temperature instability pFinFETs reliability Stress Stress measurement Thermal variables control Time measurement trapping ultra-fast measurement Voltage measurement
	A Fast Vth Measurement (FVM) Technique for NBTI Behavior Characterization 期刊论文 IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175 作者: Xiao Yu; Ran Cheng; Wei Liu; Yiming Qu; Jinghui Han 收藏 \| 浏览/下载：3/0 \| 提交时间：2019/12/26 Voltage measurement Stress Negative bias temperature instability Thermal variables control Logic gates Stress measurement Time measurement pFinFETs reliability NBTI ultra-fast measurement trapping

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