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Temporal Pattern-Aware QoS Prediction via Biased Non-Negative Latent Factorization of Tensors
期刊论文
IEEE TRANSACTIONS ON CYBERNETICS, 2020, 卷号: 50, 期号: 5, 页码: 1798-1809
作者:
Luo, Xin
;
Wu, Hao
;
Yuan, Huaqiang
;
Zhou, MengChu
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2020/08/24
Quality of service
Hidden Markov models
Data models
Training
Web services
Time factors
Latent factor analysis (LFA)
latent factorization of tensor
learning temporal pattern
linear bias (LB)
non-negative latent factorization of tensor
non-negativity constraint
quality-of-service (QoS) prediction
Corrigendum: Effect of perceived negative workplace gossip on employees' behaviors [Front. Psychol., 9, 1112, (2018)] doi: 10.3389/fpsyg.2018.01112
期刊论文
Frontiers in Psychology, 2019, 卷号: 9, 期号: JAN
作者:
Kong M.
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2019/12/11
Hostile attribution bias
In-role behavior
Organization-based self-esteem
Organizational citizenship behavior
Perceived insider status
Perceived negative workplace gossip
Effect of Perceived Negative Workplace Gossip on Employees' Behaviors (vol 9, pg 1112, 2018)
期刊论文
FRONTIERS IN PSYCHOLOGY, 2019, 卷号: 9
作者:
Kong, Ming
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/11
perceived negative workplace gossip
in-role behavior
organizational
citizenship behavior
organization-based self-esteem
perceived insider
status
hostile attribution bias
Trap-Related Nonvolatile Negative Photoconductivity in a Single Ag@Al2O3 Hybrid Nanorod for a Photomemory with Light-Writing and Bias-Erasing
期刊论文
ADVANCED OPTICAL MATERIALS, 2019
作者:
Ji, Wenwen
;
Zhou, Huiying*
;
Ye, Yalong
;
Zhao, Jie
;
Xiao, Yanhe
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/12/28
bias erasing
hybrid nanostructures
light writing
negative photoconductivity
photomemory
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure
会议论文
作者:
Huang, Yang
;
Li, Binhong
;
Zhao, Xing
;
Zheng, Zhongshan
;
Gao, Jiantou
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  |  
浏览/下载:16/0
  |  
提交时间:2019/11/26
Coupling effect
double SOI (DSOI)
negative back-gate bias
total ionizing dose (TID)
Negative magnetization and zero-field cooled exchange bias effect in Eu0.9Pr0.1CrO3 ceramics
期刊论文
PHYSICA B-CONDENSED MATTER, 2018, 卷号: 530, 页码: 95-100
作者:
Huang, Ping[1]
;
Deng, Dongmei[2]
;
Zheng, Jiashun[3]
;
Li, Qing[4]
;
Feng, Zhenjie[5]
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2019/04/24
Perovskite
Canted antiferromagnetism
Zero-field cooled exchange bias
Negative magnetization
Magnetic inhomogeneity
Enhanced Electrical Performance and Negative Bias Illumination Stability of Solution-Processed InZnO Thin-Film Transistor by Boron Addition
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 520-525
作者:
Zhong, De-Yao[1]
;
Li, Jun[2]
;
Zhao, Cheng-Yu[3]
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/24
B doping concentration
boron-doped indium-zinc-oxide (BIZO) thin-film transistors (TFTs)
negative bias illumination stress (NBIS) stability
solution process
Effect of Perceived Negative Workplace Gossip on Employees' Behaviors
期刊论文
FRONTIERS IN PSYCHOLOGY, 2018, 卷号: 9
作者:
Kong, Ming
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/11
perceived negative workplace gossip
in-role behavior
organizational
citizenship behavior
organization-based self-esteem
perceived insider
status
hostile attribution bias
A Fast Vth Measurement Technique for NBTI Behavior Characterization.
期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:
Yu, Xiao
;
Cheng, Ran
;
Liu, Wei
;
Qu, Yiming
;
Han, Jinghui
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/26
Logic gates
NBTI
Negative bias temperature instability
pFinFETs
reliability
Stress
Stress measurement
Thermal variables control
Time measurement
trapping
ultra-fast measurement
Voltage measurement
A Fast Vth Measurement (FVM) Technique for NBTI Behavior Characterization
期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:
Xiao Yu
;
Ran Cheng
;
Wei Liu
;
Yiming Qu
;
Jinghui Han
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/26
Voltage
measurement
Stress
Negative
bias
temperature
instability
Thermal
variables
control
Logic
gates
Stress
measurement
Time
measurement
pFinFETs
reliability
NBTI
ultra-fast
measurement
trapping
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