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清华大学 [19]

北京航空航天大学 [6]

西安交通大学 [5]

长春光学精密机械与物... [3]

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	Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs 期刊论文 ELECTRONICS, 2020, 卷号: 9, 期号: 8, 页码: 14 作者: Zhao, Peixiong; Liu, Tianqi; Cai, Chang; He, Ze; Li, Dongqing 收藏 \| 浏览/下载：17/0 \| 提交时间：2021/12/15 Monte-Carlo simulation single-event upset test standard three-dimensional integrated circuits ultrahigh-energy heavy ion
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者: Zhang, Ying; Chakrabarty, Krishnendu; Peng, Zebo; Rezine, Ahmed; Li, Huawei 收藏 \| 浏览/下载：19/0 \| 提交时间：2020/12/10 Circuit faults Built-in self-test Out of order Model checking Integrated circuit modeling Bounded model checking (BMC) online testing out-of-order superscalar processors software-based self-testing (SBST)
	Comparative studies on the adequacy check of parametric measurement error models with auxiliary variable 期刊论文 STATISTICAL PAPERS, 2020, 页码: 29 作者: Sun, Zhihua; Luo, Dongshan; Zhou, Xiaohua; Zhang, Qingzhao 收藏 \| 浏览/下载：13/0 \| 提交时间：2020/05/24 Weighted integrated squared distance test U-statistic test Empirical process based test Power comparisons Measurement error
	Static aeroelastic models with integrated stiffness-contributing shell structures built by additive manufacturing 期刊论文 ENGINEERING STRUCTURES, 2019, 卷号: 187, 页码: 352-361 作者: Zhu, Weijun; Miao, Kai; Li, Dichen 收藏 \| 浏览/下载：4/0 \| 提交时间：2019/11/19 Wind tunnel test Integrated structure Additive manufacturing Static aeroelastic models
	Thermal and acoustic performance of an integrated automotive thermoelectric generation system 期刊论文 APPLIED THERMAL ENGINEERING, 2019, 卷号: 158 作者: Wan, QiuShi; Liu, Xun*; Gu, Ban; Bai, WanRong; Su, ChuQi 收藏 \| 浏览/下载：1/0 \| 提交时间：2019/12/04 Temperature difference Integrated thermoelectric generator Acoustic performance Bench test
	Geophysical survey over molybdenum mines using the newly developed M-TEM system 期刊论文 JOURNAL OF APPLIED GEOPHYSICS, 2018, 卷号: 158, 页码: 65-70 作者: Di, Qing-yun; Xue, Guo-qiang; Lei, Da; Wang, Zhong-xing; Zhang, Yi-ming 收藏 \| 浏览/下载：95/0 \| 提交时间：2018/10/23 Multi-channel transient electromagnetic (M-TEM) system Pseudo random binary sequence Integrated test Earth impulse response
	Design of Test System for Arc Fault Protection Switch 会议论文作者: Su Jingjing; Xu Zhihong; Zhang Changkun 收藏 \| 浏览/下载：3/0 \| 提交时间：2019/11/21 Arc Fault Simulation Devices Arc Fault Muti-threading Integrated Test Circuit
	High-speed stereo-digital image correlation using a single color high-speed camera 期刊论文 APPLIED OPTICS, 2018, 卷号: 57, 页码: 9257-9269 作者: Yu, Liping; Pan, Bing 收藏 \| 浏览/下载：5/0 \| 提交时间：2019/12/30 CMOS integrated circuits Color Cost effectiveness High speed cameras Image analysis Speed Stereo image processing Strain measurement Accuracy and precision Aluminum panel Color cameras Cost effective Deformation measurements Digital image correlations Stationary objects Vibration test Displacement measurement
	Feedback-based integrated prediction: Defect prediction based on feedback from software testing process 期刊论文 JOURNAL OF SYSTEMS AND SOFTWARE, 2018, 卷号: 143, 页码: 159-171 作者: Xiao, Peng; Liu, Bin; Wang, Shihai 收藏 \| 浏览/下载：1/0 \| 提交时间：2019/12/30 Test resource constraints Software testing Defect prediction Feedback control Integrated prediction
	The mathematical model and novel final test system for wafer-level packaging 期刊论文 IEEE Transactions on Industrial Informatics, 2017, 卷号: 13, 期号: 4, 页码: 1817-1824 作者: Li, Junhui*; Tian, Wenya; Liao, Hailong 收藏 \| 浏览/下载：10/0 \| 提交时间：2019/12/03 Automatic final test integrated circuit (IC) modeling mathematical model measurement techniques microprobe final test through-silicon vias

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