Feedback-based integrated prediction: Defect prediction based on feedback from software testing process | |
Xiao, Peng; Liu, Bin; Wang, Shihai | |
刊名 | JOURNAL OF SYSTEMS AND SOFTWARE
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2018 | |
卷号 | 143页码:159-171 |
关键词 | Test resource constraints Software testing Defect prediction Feedback control Integrated prediction |
ISSN号 | 0164-1212 |
DOI | 10.1016/j.jss.2018.05.029 |
URL标识 | 查看原文 |
收录类别 | SCIE |
WOS记录号 | WOS:000438180000011 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5932808 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Xiao, Peng,Liu, Bin,Wang, Shihai. Feedback-based integrated prediction: Defect prediction based on feedback from software testing process[J]. JOURNAL OF SYSTEMS AND SOFTWARE,2018,143:159-171. |
APA | Xiao, Peng,Liu, Bin,&Wang, Shihai.(2018).Feedback-based integrated prediction: Defect prediction based on feedback from software testing process.JOURNAL OF SYSTEMS AND SOFTWARE,143,159-171. |
MLA | Xiao, Peng,et al."Feedback-based integrated prediction: Defect prediction based on feedback from software testing process".JOURNAL OF SYSTEMS AND SOFTWARE 143(2018):159-171. |
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