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	Feedback-based integrated prediction: Defect prediction based on feedback from software testing process
	Xiao, Peng; Liu, Bin; Wang, Shihai
刊名	JOURNAL OF SYSTEMS AND SOFTWARE
	2018
卷号	143页码:159-171
关键词	Test resource constraints Software testing Defect prediction Feedback control Integrated prediction
ISSN号	0164-1212
DOI	10.1016/j.jss.2018.05.029
URL标识	查看原文
收录类别	SCIE
WOS记录号	WOS:000438180000011
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5932808
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Xiao, Peng,Liu, Bin,Wang, Shihai. Feedback-based integrated prediction: Defect prediction based on feedback from software testing process[J]. JOURNAL OF SYSTEMS AND SOFTWARE,2018,143:159-171.
APA	Xiao, Peng,Liu, Bin,&Wang, Shihai.(2018).Feedback-based integrated prediction: Defect prediction based on feedback from software testing process.JOURNAL OF SYSTEMS AND SOFTWARE,143,159-171.
MLA	Xiao, Peng,et al."Feedback-based integrated prediction: Defect prediction based on feedback from software testing process".JOURNAL OF SYSTEMS AND SOFTWARE 143(2018):159-171.

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