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浏览/检索结果: 共2条，第1-2条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序作者升序作者降序提交时间升序提交时间降序题名升序题名降序 Charge effect in secondary electron emission from silicon surface induced by slow neon ions 期刊论文 LASER AND PARTICLE BEAMS, 2012, 卷号: 30, 页码: 319-324 作者:  Xiao, GQ;  Zhang, XA;  Wang, YY;  Wang, JG;  Zhao, YT 收藏  |  浏览/下载：13/0  |  提交时间：2017/03/28 Charge restrain factor  Electron emission yield  Highly charged ions (HCI)  Threshold velocity   Charge effect in secondary electron emission from silicon surface induced by slow neon ions 期刊论文 LASER AND PARTICLE BEAMS, 2012, 卷号: 30, 期号: [db:dc_citation_issue], 页码: 319-324 作者:  Xu, Zhongfeng;  Zeng, Lixia;  Zhao, Yongtao;  Wang, Jianguo;  Wang, Yuyu 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/10 Threshold velocity  Electron emission yield  Highly charged ions (HCI)  Charge restrain factor