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浏览/检索结果: 共7条，第1-7条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序作者升序作者降序提交时间升序提交时间降序题名升序题名降序 Chinese-German forum on Fundamentals and Technological Perspectives of Nanoscience - 26-30 September 2004, Beijing, China - Preface 期刊论文 SURFACE AND INTERFACE ANALYSIS, 2006, 卷号: 38, 期号: 6, 页码: 989 Barczewski, M; von Blanckenhagen, P; Shen, DH 收藏  |  浏览/下载：9/0  |  提交时间：2013/09/17 Fourier analysis of temporal and spatial oscillations of tunneling current in scanning tunneling microscopy 期刊论文 CHINESE PHYSICS, 2001, 卷号: 10, 页码: S19 Xie, FQ; Molitor, S; Koch, T; von Blanckenhagen, P 收藏  |  浏览/下载：16/0  |  提交时间：2013/09/17 ORIENTED PYROLITIC GRAPHITE  ELECTRON TRAPPING DEFECTS  SI(111) SURFACES  SILICON  SPECTROSCOPY   Contamination of Si surfaces in ultrahigh vacuum and formation of SiC islands 期刊论文 APPLIED SURFACE SCIENCE, 2001, 卷号: 181, 期号: 1-2, 页码: 139 Xie, F; von Blanckenhagen, P; Wu, J; Liu, JW; Zhang, QZ; Chen, YC; Wang, EG 收藏  |  浏览/下载：13/0  |  提交时间：2013/09/17 SCANNING-TUNNELING-MICROSCOPY  EPITAXIAL-GROWTH  SI(111) SURFACES  VOID FORMATION  THIN-FILMS  SI(100)  SILICON  CARBONIZATION  OSCILLATIONS  NUCLEATION   Atomic Force Microscopy studies and modeling of surface structures patterned during Ostwald ripening at Fe/Mo multilayer systems 期刊论文 CHINESE PHYSICS, 2001, 卷号: 10, 页码: S163 Shen, DH; Luo, GM; Kang, N; Lai, WY; Berlinger, A; von Blanckenhagen, P 收藏  |  浏览/下载：10/0  |  提交时间：2013/09/17 Time-dependent oscillations of tunneling current on partially oxidized Si(111) surfaces 期刊论文 APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 卷号: 72, 页码: S217 Xie, F; von Blanckenhagen, P 收藏  |  浏览/下载：8/0  |  提交时间：2013/09/23 Comparative study of harmonic oscillations of tunneling current on partially oxidized Si(100) and Si(111) surfaces by scanning tunneling microscopy and spectroscopy 期刊论文 SURFACE SCIENCE, 2000, 卷号: 454, 页码: 1031 Xie, F; Sun, M; von Blanckenhagen, P 收藏  |  浏览/下载：9/0  |  提交时间：2013/09/17 ORIENTED PYROLITIC GRAPHITE  ROOM-TEMPERATURE  SILICON  RESISTANCE   Observation of harmonic current oscillations on partially oxidized Si(111) surfaces by scanning tunneling microscopy 期刊论文 APPLIED PHYSICS LETTERS, 1999, 卷号: 75, 期号: 20, 页码: 3144 Xie, FQ; von Blanckenhagen, P 收藏  |  浏览/下载：11/0  |  提交时间：2013/09/24 ELECTRON TRAPPING DEFECTS  SILICON  RESISTANCE  TRAPS