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Fourier analysis of temporal and spatial oscillations of tunneling current in scanning tunneling microscopy
Xie, FQ ; Molitor, S ; Koch, T ; von Blanckenhagen, P
刊名CHINESE PHYSICS
2001
卷号10页码:S19
关键词ORIENTED PYROLITIC GRAPHITE ELECTRON TRAPPING DEFECTS SI(111) SURFACES SILICON SPECTROSCOPY
ISSN号1009-1963
通讯作者von Blanckenhagen, P: Forschungszentrum Karlsruhe, Inst Nanotechnol, Postfach 3640, D-76021 Karlsruhe, Germany.
中文摘要Partially oxidized Si(111) surfaces and surfaces of highly oriented pyrolytic graphite (HOPG) were studied by two different ultrahigh vacuum scanning tunneling microscope (UHV-STM) systems and by an STM system working under ambient conditions, respectively. The STM current images of partially oxidized Si(111) surfaces and HOPG surfaces were analyzed by one/two-dimensional fast Fourier transformation (1D-FFT/2D-FFT). The phenomenon of temporal oscillations of tunneling current on the partially oxidized Si (111) surfaces was detected with both UHV-STM systems. Temporal as well as spatial oscillations of tunneling current appeared in highly resolved STM current images of the Si(111) surfaces simultaneously, but both kinds of oscillations could be discriminated according to their different influence on the 2D-FFT spectra of the current images, while varying the scanning range and rate. On clean HOPG surfaces only spatial oscillations of tunneling current induced by the surface structure were observed.
收录类别SCI
语种英语
公开日期2013-09-17
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/38446]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Xie, FQ,Molitor, S,Koch, T,et al. Fourier analysis of temporal and spatial oscillations of tunneling current in scanning tunneling microscopy[J]. CHINESE PHYSICS,2001,10:S19.
APA Xie, FQ,Molitor, S,Koch, T,&von Blanckenhagen, P.(2001).Fourier analysis of temporal and spatial oscillations of tunneling current in scanning tunneling microscopy.CHINESE PHYSICS,10,S19.
MLA Xie, FQ,et al."Fourier analysis of temporal and spatial oscillations of tunneling current in scanning tunneling microscopy".CHINESE PHYSICS 10(2001):S19.
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