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Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors
期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184
作者:
Liu, BK (Liu Bingkai)[ 1,2,3 ]
;
Li, YD (Li Yudong)[ 1,2 ]
;
Wen, L (Wen Lin)[ 1,2 ]
;
Zhou, D (Zhou Dong)[ 1,2 ]
;
Feng, J (Feng Jie)[ 1,2 ]
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2021/05/10
Backside‐
illuminated CMOS image sensors
Dark signal behaviors
Displacement damage effects
Neutron irradiation
Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal
期刊论文
RADIATION PHYSICS AND CHEMISTRY, 2021, 卷号: 189, 期号: 12, 页码: 1-5
作者:
Li, YD (Li, Yudong)
;
Liu, BK (Liu, Bingkai)
;
Wen, L (Wen, Lin)
;
Wei, Y (Wei, Ying)
;
Zhou, D (Zhou, Dong)
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2021/10/14
Radiation effectsTotal ionizing dose (TID)Charge coupled device (CCD)Dark signalOxide trapped charges
A study of hot pixels induced by proton and neutron irradiations in charge coupled devices
期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550
作者:
收藏
  |  
浏览/下载:44/0
  |  
提交时间:2020/07/06
Charge coupled devices (CCDs)
proton irradiation
neutron irradiation
hot pixels
displacement damage effects
Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868
作者:
Cai, YL (Cai, Yulong)[ 1,2 ]
;
Wen, L (Wen, Lin)[ 3 ]
;
Li, YD (Li, Yudong)[ 3 ]
;
Guo, Q (Guo, Qi)[ 3 ]
;
Zhou, D (Zhou, Dong)[ 3 ]
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  |  
浏览/下载:26/0
  |  
提交时间:2020/09/09
Complementary metal-oxide-semiconductor
(CMOS) image sensors (CIS)
heavy ions
pulsed laser
single-event latchup (SEL)
single-event transient (SET)
Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors
期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021
作者:
Zhang, X (Zhang, Xiang)[ 1,2,3 ]
;
Li, YD (Li, Yudong)[ 1,2 ]
;
Wen, L (Wen, Lin)[ 1,2 ]
;
Feng, J (Feng, Jie)[ 1,2 ]
;
Zhou, D (Zhou, Dong)[ 1,2 ]
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2020/12/09
14-MeV neutron
neutron irradiation
radiation damage
radiation effect
Investigation of displacement damage to vertical-cavity surface-emitting red lasers due to 1 MeV electron radiation
期刊论文
AIP ADVANCES, 2020, 卷号: 10, 期号: 11, 页码: 1-6
作者:
Chen, JW (Chen, J. W.)[ 1,2 ]
;
Li, YD (Li, Y. D.)[ 1 ]
;
Heini, M (Heini, M.)[ 1 ]
;
Liu, BK (Liu, B. K.)[ 1,2 ]
;
Lei, QQ (Lei, Q. Q.)[ 1,2 ]
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  |  
浏览/下载:24/0
  |  
提交时间:2021/01/05
Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors
期刊论文
RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7
作者:
Liu, BK (Liu, Bingkai)[ 1,2,3 ]
;
Li, YD (Li, Yudong)[ 1,2 ]
;
Wen, L (Wen, Lin)[ 1,2 ]
;
Zhou, D (Zhou, Dong)[ 1,2 ]
;
Feng, J (Feng, Jie)[ 1,2 ]
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2021/03/19
Backside illuminated CMOS image sensor
Random telegraph signal
Radiation effects
Proton irradiation
Theoretical calculation
Electron irradiation-induced defects and photoelectric properties of Te-doped GaSb
期刊论文
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2019, 卷号: 132, 期号: 9, 页码: 26-30
作者:
Wang, DK (Wang, Dengkui)[ 1 ]
;
Chen, BK (Chen, Bingkun)[ 1 ]
;
Wei, ZP (Wei, Zhipeng)[ 1 ]
;
Fang, X (Fang, Xuan)[ 1 ]
;
Tang, JL (Tang, Jilong)[ 1 ]
收藏
  |  
浏览/下载:58/0
  |  
提交时间:2019/07/23
GaSb
Electron irradiation
Photoluminescence
Defects
Search for heavy Majorana neutrino in lepton number violating decays of D -> K pi e(+)e(+)
期刊论文
PHYSICAL REVIEW D, 2019, 卷号: 99, 期号: 11
作者:
Ablikim, M.
;
Achasov, M. N.
;
Ahmed, S.
;
Albrecht, M.
;
Alekseev, M.
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/12/05
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