×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
西安交通大学 [12]
新疆理化技术研究所 [10]
高能物理研究所 [8]
兰州大学 [4]
国家天文台 [2]
湖南大学 [2]
更多...
内容类型
期刊论文 [38]
会议论文 [12]
预印本 [1]
发表日期
2022 [2]
2021 [3]
2020 [7]
2019 [11]
2018 [7]
2017 [9]
更多...
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共51条,第1-10条
帮助
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
发表日期升序
发表日期降序
作者升序
作者降序
提交时间升序
提交时间降序
题名升序
题名降序
ET White Paper: To Find the First Earth 2.0
预印本
2022
作者:
Ge, Jian
;
Zhang, Hui
;
Zang, Weicheng
;
Deng, Hongping
;
Mao, Shude
收藏
  |  
浏览/下载:50/0
  |  
提交时间:2022/07/29
Total Ionizing Dose Effects of the Color Complementary Metal Oxide Semiconductor (CMOS) Image Sensor at Different Bias
期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2022, 卷号: 17, 期号: 1, 页码: 121-127
作者:
Yang, ZK (Yang, Zhikang) [1] , [2]
;
Wen, L (Wen, Lin) [1]
;
Li, YD (Li, Yudong) [1]
;
Liu, BK (Liu, Bingkai) [1] , [2]
;
Fu, J (Fu, Jing) [1] , [2]
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2022/06/21
Color CMOS Image Sensor
Radiation Damage
Total Ionizing Dose Effects
Bias Condition
Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors
期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184
作者:
Liu, BK (Liu Bingkai)[ 1,2,3 ]
;
Li, YD (Li Yudong)[ 1,2 ]
;
Wen, L (Wen Lin)[ 1,2 ]
;
Zhou, D (Zhou Dong)[ 1,2 ]
;
Feng, J (Feng Jie)[ 1,2 ]
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2021/05/10
Backside‐
illuminated CMOS image sensors
Dark signal behaviors
Displacement damage effects
Neutron irradiation
Insight-HXMT observations of jet-like corona in a black hole X-ray binary MAXI J1820+070
期刊论文
Nature Communications, 2021, 卷号: 12, 页码: 1025
作者:
You, Bei
;
Tuo, Yuoli
;
Li, Chengzhe
;
Wang, Wei
;
Zhang, Shuang-Nan
收藏
  |  
浏览/下载:75/0
  |  
提交时间:2021/11/18
Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal
期刊论文
RADIATION PHYSICS AND CHEMISTRY, 2021, 卷号: 189, 期号: 12, 页码: 1-5
作者:
Li, YD (Li, Yudong)
;
Liu, BK (Liu, Bingkai)
;
Wen, L (Wen, Lin)
;
Wei, Y (Wei, Ying)
;
Zhou, D (Zhou, Dong)
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2021/10/14
Radiation effectsTotal ionizing dose (TID)Charge coupled device (CCD)Dark signalOxide trapped charges
Modes of genetic adaptations underlying functional innovations in the rumen
期刊论文
SCIENCE CHINA-LIFE SCIENCES, 2020, 页码: 21
作者:
Pan, Xiangyu
;
Cai, Yudong
;
Li, Zongjun
;
Chen, Xianqing
;
Heller, Rasmus
收藏
  |  
浏览/下载:82/0
  |  
提交时间:2021/01/14
rumen innovations
comparative transcriptomics
comparative genomics
evo-devo
evolution of organs
Modes of genetic adaptations underlying functional innovations in the rumen
期刊论文
SCIENCE CHINA-LIFE SCIENCES, 2020, 页码: 21
作者:
Pan, Xiangyu
;
Cai, Yudong
;
Li, Zongjun
;
Chen, Xianqing
;
Heller, Rasmus
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2021/01/04
rumen innovations
comparative transcriptomics
comparative genomics
evo-devo
evolution of organs
The Medium Energy X-ray telescope (ME) onboard the Insight-HXMT astronomy satellite
期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2020, 卷号: 63, 期号: 4, 页码: 249504
作者:
Cao, XueLei
;
Jiang, WeiChun
;
Meng, Bin
;
Zhang, WanChang
;
Luo, Tao
收藏
  |  
浏览/下载:33/0
  |  
提交时间:2020/10/19
dSi-PIN
ASIC
medium energy X-ray
A study of hot pixels induced by proton and neutron irradiations in charge coupled devices
期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550
作者:
Liu, BK (Liu, Bingkai)[ 1,2,3 ]
;
Li, YD (Li, Yudong)[ 1,2 ]
;
Wen, L (Wen, Lin)[ 1,2 ]
;
Zhou, D (Zhou, Dong)[ 1,2 ]
;
Feng, J (Feng, Jie)[ 1,2 ]
收藏
  |  
浏览/下载:51/0
  |  
提交时间:2020/07/06
Charge coupled devices (CCDs)
proton irradiation
neutron irradiation
hot pixels
displacement damage effects
Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868
作者:
Cai, YL (Cai, Yulong)[ 1,2 ]
;
Wen, L (Wen, Lin)[ 3 ]
;
Li, YD (Li, Yudong)[ 3 ]
;
Guo, Q (Guo, Qi)[ 3 ]
;
Zhou, D (Zhou, Dong)[ 3 ]
收藏
  |  
浏览/下载:30/0
  |  
提交时间:2020/09/09
Complementary metal-oxide-semiconductor
(CMOS) image sensors (CIS)
heavy ions
pulsed laser
single-event latchup (SEL)
single-event transient (SET)
©版权所有 ©2017 CSpace - Powered by
CSpace