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CORC

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Total Ionizing Dose Effects of the Color Complementary Metal Oxide Semiconductor (CMOS) Image Sensor at Different Bias 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2022, 卷号: 17, 期号: 1, 页码: 121-127
作者:  Yang, ZK (Yang, Zhikang) [1] , [2];  Wen, L (Wen, Lin) [1];  Li, YD (Li, Yudong) [1];  Liu, BK (Liu, Bingkai) [1] , [2];  Fu, J (Fu, Jing) [1] , [2]
收藏  |  浏览/下载：26/0  |  提交时间：2022/06/21
Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184
作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ];  Zhou, D (Zhou Dong)[ 1,2 ];  Feng, J (Feng Jie)[ 1,2 ]
收藏  |  浏览/下载：34/0  |  提交时间：2021/05/10
Insight-HXMT observations of jet-like corona in a black hole X-ray binary MAXI J1820+070 期刊论文
Nature Communications, 2021, 卷号: 12, 页码: 1025
作者:  You, Bei;  Tuo, Yuoli;  Li, Chengzhe;  Wang, Wei;  Zhang, Shuang-Nan
收藏  |  浏览/下载：72/0  |  提交时间：2021/11/18
Modes of genetic adaptations underlying functional innovations in the rumen 期刊论文
SCIENCE CHINA-LIFE SCIENCES, 2020, 页码: 21
作者:  Pan, Xiangyu;  Cai, Yudong;  Li, Zongjun;  Chen, Xianqing;  Heller, Rasmus
收藏  |  浏览/下载：80/0  |  提交时间：2021/01/14
Modes of genetic adaptations underlying functional innovations in the rumen 期刊论文
SCIENCE CHINA-LIFE SCIENCES, 2020, 页码: 21
作者:  Pan, Xiangyu;  Cai, Yudong;  Li, Zongjun;  Chen, Xianqing;  Heller, Rasmus
收藏  |  浏览/下载：30/0  |  提交时间：2021/01/04
Proton Transfer Can Govern Regioselectivity Assisted by Iron Catalysis 期刊论文
iScience, 2020, 卷号: 23, 期号: 6, 页码: 101214
作者:  Yudong Li;  Liyan Fu;  Xiaolin Jiang,;  Dongmei Zhao;  Hui-Fang Wang
收藏  |  浏览/下载：11/0  |  提交时间：2020/12/07
A study of hot pixels induced by proton and neutron irradiations in charge coupled devices 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550
作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]
收藏  |  浏览/下载：50/0  |  提交时间：2020/07/06
Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868
作者:  Cai, YL (Cai, Yulong)[ 1,2 ];  Wen, L (Wen, Lin)[ 3 ];  Li, YD (Li, Yudong)[ 3 ];  Guo, Q (Guo, Qi)[ 3 ];  Zhou, D (Zhou, Dong)[ 3 ]
收藏  |  浏览/下载：29/0  |  提交时间：2020/09/09
Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors 期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021
作者:  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]
收藏  |  浏览/下载：25/0  |  提交时间：2020/12/09
Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors 期刊论文
RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7
作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]
收藏  |  浏览/下载：24/0  |  提交时间：2021/03/19

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