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长春光学精密机械与物... [1]
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会议论文 [1]
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2008 [1]
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Contour extracting with combination particle filtering and em algorithm (EI CONFERENCE)
会议论文
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Related Technologies and Applications, September 9, 2007 - September 12, 2007, Beijing, China
Meng B.
;
Zhu M.
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提交时间:2013/03/25
The problem of extracting continuous structures from images is a difficult issue in early pattern recognition and image processings[1]. Tracking with contours in a filtering framework requires a dynamical model for prediction. Recently
Particle filter
is widely used because its multiple hypotheses and versatility within framework. However
the good choice of the propagation function is still its main problem. In this paper
an improved particle filter
EM-PF algorithm is proposed which using the EM (Expectation-Maximization) algorithm to learn the dynamical models. The EM algorithm can explicitly learn the parameters of the dynamical models from training sequences. The advantage of using the EM algorithm in particle filter is that it is capable of improve tracking contour by having accurate model parameters. Though the experiment results
we show how our EM-PF can be applied to produces more robust and accurate extracting.
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