QQ客服 官方微博 反馈留言

	Contour extracting with combination particle filtering and em algorithm (EI CONFERENCE)
	Meng B. ; Zhu M.
	2008
会议名称	International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Related Technologies and Applications, September 9, 2007 - September 12, 2007
会议地点	Beijing, China
关键词	The problem of extracting continuous structures from images is a difficult issue in early pattern recognition and image processings[1]. Tracking with contours in a filtering framework requires a dynamical model for prediction. Recently Particle filter is widely used because its multiple hypotheses and versatility within framework. However the good choice of the propagation function is still its main problem. In this paper an improved particle filter EM-PF algorithm is proposed which using the EM (Expectation-Maximization) algorithm to learn the dynamical models. The EM algorithm can explicitly learn the parameters of the dynamical models from training sequences. The advantage of using the EM algorithm in particle filter is that it is capable of improve tracking contour by having accurate model parameters. Though the experiment results we show how our EM-PF can be applied to produces more robust and accurate extracting.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33706]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Meng B.,Zhu M.. Contour extracting with combination particle filtering and em algorithm (EI CONFERENCE)[C]. 见:International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Related Technologies and Applications, September 9, 2007 - September 12, 2007. Beijing, China.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。