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长春光学精密机械与物... [1]
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会议论文 [1]
发表日期
2012 [1]
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Image registration based on Mexican-hat wavelets and pseudo-Zernike moments (EI CONFERENCE)
会议论文
2012 World Automation Congress, WAC 2012, June 24, 2012 - June 28, 2012, Puerto Vallarta, Mexico
Ding N.
;
Liu Y.
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提交时间:2013/03/25
Image registration is a key technique in pattern recognition and image processing
and it is widely used in many application areas such as computer vision
remote sensing
image fusion and object tracking. A method for image registration combining Mexican-hat wavelets and pseudo-Zernike moments is proposed. Firstly
feature points are extracted using scale-interaction Mexican-hat wavelets in the reference image and sensed image respectively. Then
pseudo-Zernike moments are used to match them and classical RANSAC used to eliminate the wrong matches. And then
the well match points are used to estimate the best affine transform parameters by least squares minimization. At last
the sensed image is transformed and resampled to accomplish the image registration. The experiments indicate that the proposed algorithm extracts feature points and matches them exactly and eliminates wrong matched points effectively and achieves nice registration results. 2012 TSI Press.
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