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	Image registration based on Mexican-hat wavelets and pseudo-Zernike moments (EI CONFERENCE)
	Ding N. ; Liu Y.
	2012
会议名称	2012 World Automation Congress, WAC 2012, June 24, 2012 - June 28, 2012
会议地点	Puerto Vallarta, Mexico
关键词	Image registration is a key technique in pattern recognition and image processing and it is widely used in many application areas such as computer vision remote sensing image fusion and object tracking. A method for image registration combining Mexican-hat wavelets and pseudo-Zernike moments is proposed. Firstly feature points are extracted using scale-interaction Mexican-hat wavelets in the reference image and sensed image respectively. Then pseudo-Zernike moments are used to match them and classical RANSAC used to eliminate the wrong matches. And then the well match points are used to estimate the best affine transform parameters by least squares minimization. At last the sensed image is transformed and resampled to accomplish the image registration. The experiments indicate that the proposed algorithm extracts feature points and matches them exactly and eliminates wrong matched points effectively and achieves nice registration results. 2012 TSI Press.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/34050]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Ding N.,Liu Y.. Image registration based on Mexican-hat wavelets and pseudo-Zernike moments (EI CONFERENCE)[C]. 见:2012 World Automation Congress, WAC 2012, June 24, 2012 - June 28, 2012. Puerto Vallarta, Mexico.

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