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浏览/检索结果: 共7条，第1-7条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Insight Into Gate-Induced Drain Leakage in Silicon Nanowire Transistors 期刊论文 ieee电子器件汇刊, 2015 Fan, Jiewen; Li, Ming; Xu, Xiaoyan; Yang, Yuancheng; Xuan, Haoran; Huang, Ru 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10 Band-to-band tunneling (BTBT)  CMOS technology  gate-induced drain leakage (GIDL)  power consumption  silicon nanowire transistors (SNWTs)  CMOS TECHNOLOGY  MOSFET  GIDL  DEVICES  DESIGN   Self-Heating Effects in Gate-all-around Silicon Nanowire MOSFETs: Modeling and Analysis 其他 2012-01-01 Huang, Xin; Zhang, Tianwei; Wang, Rusheng; Liu, Changze; Liu, Yuchao; Huang, Ru 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 Gate-all-around (GAA)  silicon nanowire MOSFET (SNWT)  self-heating effect  equivalent thermal network  DEVICES  PERFORMANCE   Investigation of Nanowire Line-Edge Roughness in Gate-All-Around Silicon Nanowire MOSFETs 期刊论文 ieee电子器件汇刊, 2010 Yu, Tao; Wang, Runsheng; Huang, Ru; Chen, Jiang; Zhuge, Jing; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 Intrinsic parameter fluctuation  line-edge roughness (LER)  silicon nanowire MOSFET (SNWT)  variability  INTRINSIC PARAMETER FLUCTUATIONS  FINFET MATCHING PERFORMANCE  CARRIER TRANSPORT  CMOS TECHNOLOGY  IMPACT  TRANSISTORS  DEVICES  DECANANOMETER  VARIABILITY  INTEGRATION   Negative-Bias Temperature Instability in Gate-All-Around Silicon Nanowire MOSFETs: Characteristic Modeling and the Impact on Circuit Aging 期刊论文 ieee电子器件汇刊, 2010 Liu, Changze; Yu, Tao; Wang, Runsheng; Zhang, Liangliang; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10 Circuit aging  negative-bias temperature instability (NBTI) modeling  process variations  silicon nanowire MOSFET (SNWT)  NBTI DEGRADATION  MOS DEVICES  TRANSISTORS  INTERFACE  RELIABILITY  TRANSPORT  DYNAMICS  CARRIER   Compact Negative Bias Temperature Instability Model for Silicon Nanowire MOSFET (SNWT) and Application in Circuit Performance Simulation 期刊论文 journal of computational and theoretical nanoscience, 2010 Ma, Chenyue; Li, Bo; Wang, Hao; Zhang, Xing; He, Jin 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/16 Nanowire Transistor  NBTI  Compact Modeling  Probability  Reaction-Diffusion  Circuit Simulation   Investigation on the effective immunity to process induced line-edge roughness in silicon nanowire MOSFETs 其他 2010-01-01 Yu, Tao; Ding, Wei; Zhuge, Jing; Zhang, Liangliang; Wang, Runsheng; Ru, Huang 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 Investigation on Self-Heating Effect in Gate-All-Around Silicon Nanowire MOSFETs From Top-Down Approach 期刊论文 ieee electron device letters, 2009 Wang, Runsheng; Zhuge, Jing; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/10 Gate-all-around (GAA)  self-heating effect  silicon nanowire MOSFET (SNWT)  THERMAL-CONDUCTIVITY  CARRIER TRANSPORT  TRANSISTORS  CONDUCTANCE