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浏览/检索结果: 共6条，第1-6条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Run-time technique for simultaneous aging and power optimization in gpgpus 其他 2014-01-01 Chen, Xiaoming; Wang, Yu; Liang, Yun; Xie, Yuan; Yang, Huazhong 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 Unified Reaction-Diffusion Model for Accurate Prediction of Negative Bias Temperature Instability Effect 期刊论文 日本应用物理学杂志, 2012 Ma, Chenyue; Mattausch, Hans Juergen; Miyake, Masataka; Matsuzawa, Kazuya; Iizuka, Takahiro; Yamaguchi, Seiichiro; Hoshida, Teruhiko; Kinoshita, Akinari; Arakawa, Takahiko; He, Jin; Miura-Mattausch, Mitiko 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 NBTI DEGRADATION  TRAP GENERATION  P-MOSFETS  INTERFACE   Temperature-aware NBTI modeling techniques in digital circuits 期刊论文 2010, 2010 Hong Luo; Yu Wang; Rong Luo; Huazhong Yang; Yuan Xie 收藏  |  浏览/下载：2/0 Negative-Bias Temperature Instability in Gate-All-Around Silicon Nanowire MOSFETs: Characteristic Modeling and the Impact on Circuit Aging 期刊论文 ieee电子器件汇刊, 2010 Liu, Changze; Yu, Tao; Wang, Runsheng; Zhang, Liangliang; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10 Circuit aging  negative-bias temperature instability (NBTI) modeling  process variations  silicon nanowire MOSFET (SNWT)  NBTI DEGRADATION  MOS DEVICES  TRANSISTORS  INTERFACE  RELIABILITY  TRANSPORT  DYNAMICS  CARRIER   Compact Negative Bias Temperature Instability Model for Silicon Nanowire MOSFET (SNWT) and Application in Circuit Performance Simulation 期刊论文 journal of computational and theoretical nanoscience, 2010 Ma, Chenyue; Li, Bo; Wang, Hao; Zhang, Xing; He, Jin 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/16 Nanowire Transistor  NBTI  Compact Modeling  Probability  Reaction-Diffusion  Circuit Simulation   The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 页码: 173-183 作者:  Wang, Wenping[1];  Yang, Shengqi[2];  Bhardwaj, Sarvesh[3];  Vrudhula, Sarma[4];  Liu, Frank[5] 收藏  |  浏览/下载：2/0  |  提交时间：2019/04/30 Duty cycle  input pattern  negative bias temperature instability (NBTI)  performance degradation  speed  supply voltage  temperature