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长春光学精密机械与物... [1]
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会议论文 [1]
发表日期
2010 [1]
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Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE)
会议论文
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Yang P.
;
Ai H.
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提交时间:2013/03/25
Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules
allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity
polarization
phase plate
primary aberrations
STED pulse shape
pulse duration and delay time. In this paper
we found related models and simulate the relationship between the depletion patterns and the parameters
and put forward effective approach to enhance the system resolution. 2010 SPIE.
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